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Operational effectiveness and quality assurance mechanisms with stochastic demand of blood supply: blood bank case study.
Alan D. Smith IJEH 6(2/3/4):174-191 (2011)
to dblp by dblp on Feb 10, 2012, 12:00 AM
URL | BibTeX
Experimental demonstration of an active quantum key distribution network with over gbps clock synchronization.
Lijun Ma, Alan Mink, Hai Xu, Oliver Slattery, and Xiao Tang IEEE Communications Letters 11(12):1019-1021 (2007)
to dblp by dblp on Feb 10, 2012, 12:00 AM
URL | BibTeX
Bayesian analysis of generalized frequency-modulated signals.
Keith Copsey, Neil J. Gordon, and Alan Marrs IEEE Transactions on Signal Processing 50(3):725-735 (2002)
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URL | BibTeX
Developing Web Prototypes for Mobile-Learning Design Research.
Alan Foley, and Heng Luo IJMBL 4(1):31-44 (2012)
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Proof planning Non-standard Analysis.
Ewen Maclean, Jacques D. Fleuriot, and Alan Smaill ISAIM, (2002)
to dblp by dblp and 1 other user on Feb 10, 2012, 12:00 AM
URL | BibTeX
Policing and traffic shaping at the user-network-interface UNI.
Gísli Hjálmtýsson, and Alan G. Konheim Telecommunication Systems 6(1):261-288 (1996)
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Stress profile derivation-an empirical approach.
Alan C. Walker ITC, page 193-207. IEEE Computer Society, (1990)
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A Formal Mathematical Framework for Modeling Probabilistic Hybrid Systems.
Robert St-Aubin, Joel Friedman, and Alan K. Mackworth ISAIM, (2006)
to dblp by dblp and 1 other user on Feb 9, 2012, 12:00 AM
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An Algebraic Approach to Reverse Engineering Finite Dynamical Systems Arising from Biology.
Alan Veliz-Cuba SIAM J. Applied Dynamical Systems 11(1):31-48 (2012)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Scalable don't-care-based logic optimization and resynthesis.
Alan Mishchenko, Robert K. Brayton, Jie-Hong R. Jiang, and Stephen Jang TRETS 4(4):34 (2011)
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A Family of CCCP Algorithms Which Minimize the TRW Free Energy.
Yu Nishiyama, Xingyao Ye, and Alan L. Yuille New Generation Comput. 30(1):3-16 (2012)
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From information to operations: Service quality and customer retention.
Balaji Padmanabhan, Alan R. Hevner, Michael Cuenco, and Crystal Shi ACM Trans. Management Inf. Syst. 2(4):21 (2011)
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The IBM T221 9.2M Pixel Display.
Alan D. Jones Handbook of Visual Display Technology, Springer, (2012)
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CMOS IC reliability indicators and burn-in economics.
Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, and Peter C. Maxwell ITC, page 194-203. IEEE Computer Society, (1998)
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iDD Pulse Response Testing Applied to Complex CMOS ICs.
J. S. Beasley, S. Pour-Mozafari, D. Huggett, Alan W. Righter, and C. J. Apodaca ITC, page 32-39. IEEE Computer Society, (1997)
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High Resolution IDDQ Characterization and Testing - Practical Issues.
Alan W. Righter, Jerry M. Soden, and Richard W. Beegle ITC, page 259-268. IEEE Computer Society, (1996)
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Solving Known Good Die and Substrate Test Issues.
Alan W. Righter ITC, page 916. IEEE Computer Society, (1995)
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Defect Classes - An Overdue Paradigm for CMOS IC.
Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, and F. Joel Ferguson ITC, page 413-425. IEEE Computer Society, (1994)
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A Serially Addressable, Flexible Current Monitor for Test Fixture Based IDDQ/ISSQ Testing.
Alan Hales ITC, page 223-232. IEEE Computer Society, (1994)
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A General Purpose IDDQ Measurement Circuit.
Kenneth M. Wallquist, Alan W. Righter, and Charles F. Hawkins ITC, page 642-651. IEEE Computer Society, (1993)
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