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Word line pulsing technique for stability fault detection in SRAM cells.
Andrei Pavlov, Mohamed Azimane, José Pineda de Gyvez, and Manoj Sachdev ITC, page 10. IEEE, (2005)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Memory Testing Under Different Stress Conditions: An Industrial Evaluation
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, and Fred Bowen CoRR (2007)
to dblp by dblp on Dec 5, 2011, 12:00 AM
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Test quality analysis and improvement for an embedded asynchronous FIFO.
Tobias Dubois, Erik Jan Marinissen, Mohamed Azimane, Paul Wielage, Erik Larsson, and Clemens Wouters DATE, page 859-864. ACM, (2007)
to dblp by dblp on Jun 22, 2007, 12:00 AM
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High-Quality Memory Test.
Mohamed Azimane MTDT, IEEE Computer Society, (2006)
to dblp by dblp on Sep 26, 2006, 12:00 AM
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A New Algorithm for Dynamic Faults Detection in RAMs.
Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, and Maurice Lousberg VTS, page 177-182. IEEE Computer Society, (2005)
to dblp by dblp on Jan 23, 2006, 12:00 AM
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Memory Testing Under Different Stress Conditions: An Industrial Evaluation.
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, and Fred Bowen DATE, page 438-443. IEEE Computer Society, (2005)
to dblp by dblp on Apr 13, 2005, 12:00 AM
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New Test Methodology for Resistive Open Defect Detection in Memory Address Decoders.
Mohamed Azimane, and Ananta K. Majhi VTS, page 123-128. IEEE Computer Society, (2004)
to dblp by dblp on Jun 21, 2004, 12:00 AM
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