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Data Partitioning and Redundancy Management for Robust Multi-Tenancy SaaS.
Wei-Tek Tsai, Yu Huang 0008, Qihong Shao, and Xiaoying Bai Int. J. Software and Informatics 4(3):437-471 (2010)
to dblp by dblp on Feb 10, 2012, 12:00 AM
URL | BibTeX
Nonlinear System Modeling With Random Matrices: Echo State Networks Revisited.
Bai Zhang, David J. Miller, and Yue Wang IEEE Trans. Neural Netw. Learning Syst. 23(1):175-182 (2012)
to dblp by dblp on Feb 10, 2012, 12:00 AM
URL | BibTeX
On the Performance of Short Forward Error-Correcting Codes.
Sheng Tong, Dengsheng Lin, Aleksandar Kavcic, Li Ping, and Baoming Bai IEEE Communications Letters 11(11):880-882 (2007)
to dblp by dblp on Feb 10, 2012, 12:00 AM
URL | BibTeX
An empirical investigation on factors influencing the adoption of mobile phone call centre services: an integrated model.
Kanliang Wang, Yanli Bai, and Yanzhen Yue International Journal of Internet and Enterprise Management 7(3):287-304 (2011)
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URL | BibTeX
Enhanced Feedback Iterative Decoding of Sparse Quantum Codes.
Yun-Jiang Wang, Barry C. Sanders, Bao-Ming Bai, and Xin-Mei Wang IEEE Transactions on Information Theory 58(2):1231-1241 (2012)
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URL | BibTeX
Observer-Based Exponential Stability Analysis for Networked Control Systems with Packet Dropout.
Xue Li, Jia min Weng, Dajun Du, and Haoliang Bai ICIC 1, volume 6838 of Lecture Notes in Computer Science, page 694-700. Springer, (2011)
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A blind approach to Hammerstein model identification.
Er-Wei Bai, and Minyue Fu IEEE Transactions on Signal Processing 50(7):1610-1619 (2002)
to dblp by dblp on Feb 9, 2012, 12:00 AM
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Constructing narratives using fast feedback.
Yi-Ling Lin, Xiaoning Bai, Yuanyuan Ye, and William Real iConference, page 486-487. ACM, (2012)
to dblp by dblp on Feb 9, 2012, 12:00 AM
URL | BibTeX
Collaborative personalized top-k processing.
Xiao Bai, Rachid Guerraoui, Anne-Marie Kermarrec, and Vincent Leroy ACM Trans. Database Syst. 36(4):26 (2011)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Multi-pattern Matching with Wildcards.
Meng Zhang, Yi Zhang, Jijun Tang, and Xiaolong Bai JSW 6(12):2391-2398 (2011)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Robust visual tracking with structured sparse representation appearance model.
Tianxiang Bai, and Y. F. Li Pattern Recognition 45(6):2390-2404 (2012)
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Noncontact wafer probe using wireless probe cards.
Chris Sellathamby, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Steven Slupsky, Igor M. Filanovsky, and Kris Iniewski ITC, page 6. IEEE, (2005)
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A static noise impact analysis methodology for evaluating transient error effects in digital VLSI circuits.
Chong Zhao, Xiaoliang Bai, and Sujit Dey ITC, page 10. IEEE, (2005)
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Verification and debugging of IDDQ test of low power chips.
Michael Laisne, Triphuong Nguyen, Song lin Zuo, Xiangdong Pan, Hailong Cui, Cher Bai, A. Street, M. Parley, Neetu Agrawal, and K. Sundararaman ITC, page 1-7. IEEE, (2007)
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High throughput non-contact SiP testing.
Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, and Steven Slupsky ITC, page 1-10. IEEE, (2007)
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URL | BibTeX
Using random walks for multi-label classification.
Chaokun Wang, Wei Zheng, Zhang Liu, Yiyuan Bai, and Jianmin Wang 0001 CIKM, page 2197-2200. ACM, (2011)
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MUSIZ: a generic framework for music resizing with stretching and cropping.
Zhang Liu, Chaokun Wang, Yiyuan Bai, Hao Wang, and Jianmin Wang 0001 ACM Multimedia, page 523-532. ACM, (2011)
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Blind source separation of signals with known alphabets using &epsi;-approximation algorithms.
Qingyu Li, Er-Wei Bai, and Zhi Ding IEEE Transactions on Signal Processing 51(1):1-10 (2003)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Power scan: DFT for power switches in VLSI designs.
Bing-Chuan Bai, Chien-Mo James Li, Augusli Kifli, Even Tsai, and Kun-Cheng Wu ITC, page 1. IEEE, (2009)
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Non-contact Testing for SoC and RCP SIPs at Advanced Nodes.
Brian Moore, Marc Mangrum, Chris Sellathamby, Md. Mahbub Reja, T. Weng, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, and Steven Slupsky ITC, page 1-10. IEEE, (2008)
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