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Macro-testability and the VSP.
R. Mehtani, Keith Baker, C. M. Huizer, P. J. Hynes, and Jos van Beers ITC, page 739-748. IEEE Computer Society, (1990)
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IDDQ testing because `zero defects isn't enough': a Philips perspective.
Keith Baker, and Bas Verhelst ITC, page 253-254. IEEE Computer Society, (1990)
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The Display Industry in a Green World.
Keith J. Baker Handbook of Visual Display Technology, Springer, (2012)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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SIA Roadmaps: Sunset Boulevard for l_DDQ.
Keith Baker ITC, page 1121. IEEE Computer Society, (1999)
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Spice up your life: simulate mixed-signal ICs!
Keith Baker ITC, page 1131. IEEE Computer Society, (1998)
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Shmoo Plots - the Black Art of IC Test.
Keith Baker, and Jos van Beers ITC, page 932-933. IEEE Computer Society, (1996)
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Plug & Play IDDQ Monitoring with QTAG.
Keith Baker, T. F. Waayers, F. G. M. Bouwman, and M. J. W. Verstraelen ITC, page 739-749. IEEE Computer Society, (1995)
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Stuck-at Faults, PPMs Rejects or? What doe the SIA Roadmaps Say?
Keith Baker ITC, page 299. IEEE Computer Society, (1995)
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Development of a CLASS 1 QTAG Monitor.
Keith Baker, A. Bratt, Andrew M. D. Richardson, and A. Welbers ITC, page 213-222. IEEE Computer Society, (1994)
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Analogue Fault Simulation Based on Layout-Dependent Fault Models.
R. J. A. Harvey, Andrew M. D. Richardson, Eric Bruls, and Keith Baker ITC, page 641-649. IEEE Computer Society, (1994)
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QTAG: A Standard for Test Fixture Based IDDQ/ISSQ Monitors.
Keith Baker ITC, page 194-202. IEEE Computer Society, (1994)
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Application of Joint Time-Frequency Analysis in Mixed-Signal Testing.
Frank Bouwman, Taco Zwemstra, Sonny Hartanto, Keith Baker, and Jan Koopmans ITC, page 747-756. IEEE Computer Society, (1994)
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Parameter Monitoring: Advantages and Pitfalls.
M. M. A. van Rosmalen, Keith Baker, Eric Bruls, and Jochen A. G. Jess ITC, page 115-124. IEEE Computer Society, (1993)
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Improving Total IC Design Quality Using Application Mode Testing.
R. Mehtani, M. De Jonghe, Richard Morren, and Keith Baker ITC, page 866-872. IEEE Computer Society, (1992)
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Time-to-Market: An Issue in Mixed-signal vs. Analogue.
Keith Baker ITC, page 254. IEEE Computer Society, (1992)
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Using EDIF for Transfer of Test Data: Practical Experience.
Bas Verhelst, Richard Morren, and Keith Baker ITC, page 459-465. IEEE Computer Society, (1992)
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Constructive Pattern Generation Heuristic for Meeting SSO Limits.
Kendrick Baker ITC, page 368. IEEE Computer Society, (2003)
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Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
Will R. Moore, Guido Gronthoud, Keith Baker, and Maurice Lousberg ITC, page 95-104. IEEE Computer Society, (2000)
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A reduced voltage swing circuit using a single supply to enable lower voltage operation for SRAM-based memory.
Baker Mohammad, and Jacob A. Abraham Microelectronics Journal 43(2):110-118 (2012)
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Libraries, Languages of Description, and Linked Data: a Dublin Core perspective.
Thomas Baker Library Hi Tech (2012)
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