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publications

(7)

• Heart Failure Monitoring System Based on Wearable and Information Technologies.
  Elena Villalba and María Teresa Arredondo and M. Ottaviano and D. Salvi and E. Hoyo-Barbolla and S. Guillen JCM 2 10-21 (2007)
  to dblp by dblp on 2008-08-15 00:00:00
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• Equilibrium and quasi-equilibrium existence theorems for a general model without ordered preferences
  Rosa Barbolla Economics Letters 19 205--210 (1985)
  to imported by smicha on 2008-04-21 22:09:52
  | URL | BibTeX  
• Medical Informatics and Bioinformatics: A Bibliometric Study.
  Jean-Yves Bansard and Dietrich Rebholz-Schuhmann and Graham Cameron and Dominic Clark and Erik M. van Mulligen and Francesco Beltrame and Eva del Hoyo-Barbolla and Fernando Martín-Sánchez and Luciano Milanesi and Ioannis G. Tollis and Johan van der Lei and Jean-Louis Coatrieux IEEE Transactions on Information Technology in Biomedicine 11 237-243 (2007)
  to dblp by dblp on 2008-02-26 00:00:00
  | URL | BibTeX  
• Results of a Tailored Communication Framework Through E-Health.
  Eva del Hoyo-Barbolla and Emanuele Carisio and Marta Ortega-Portillo and María Teresa Arredondo HCI (13) 269-278 (2007)
  to dblp by dblp on 2007-08-31 00:00:00
  | URL | BibTeX  
• A new solution for a Heart Failure Monitoring system based on Wearable and Information Technologies.
  Elena Villalba and María Teresa Arredondo and E. Hoyo-Barbolla and S. Guillen BSN 150-153 (2006)
  to dblp by dblp on 2007-08-29 00:00:00
  | URL | BibTeX  
• On the influence of substrate cleaning method and rapid thermal annealing conditions on the electrical characteristics of Al/SiNx/SiO2/Si fabricated by ECR-CVD.
  S. Dueñas and H. Castán and H. García and J. Barbolla and E. San Andrés and I. Mártil and G. González-Díaz Microelectronics Reliability 45 978-981 (2005)
  to dblp by dblp on 2007-03-27 00:00:00
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• Electrical characterization of hafnium oxide and hafnium-rich silicate films grown by atomic layer deposition.
  S. Dueñas and H. Castán and H. García and J. Barbolla and K. Kukli and J. Aarik and M. Ritala and M. Leskelä Microelectronics Reliability 45 949-952 (2005)
  to dblp by dblp on 2007-03-27 00:00:00
  | URL | BibTeX