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A Testable Realization of CMOS Combinational Circuits.
Sreejit Chakravarty ITC, page 509-518. IEEE Computer Society, (1989)
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A new framework for generating optimal March tests for memory arrays.
Kamran Zarrineh, Shambhu J. Upadhyaya, and Sreejit Chakravarty ITC, page 73-82. IEEE Computer Society, (1998)
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A Study of IDDQ Subset Selection Algorithms for Bridging Faults.
Sreejit Chakravarty, and Paul J. Thadikaran ITC, page 403-412. IEEE Computer Society, (1994)
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A scalable and efficient methodology to extract two node bridges from large industrial circuits.
Sujit T. Zachariah, and Sreejit Chakravarty ITC, page 750-759. IEEE Computer Society, (2000)
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An analysis of the delay defect detection capability of the ECR test method.
Seonki Kim, Sreejit Chakravarty, and Bapiraju Vinnakota ITC, page 1060-1069. IEEE Computer Society, (2000)
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Logic proximity bridges.
Eric N. Tran, Vamsee Krishna, Sujit T. Zachariah, and Sreejit Chakravarty ITC, page 10. IEEE, (2005)
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Exact At-speed Delay Fault Grading in Sequential Circuits.
Mahilchi Milir Vaseekar Kumar, Spyros Tragoudas, Sreejit Chakravarty, and Rathish Jayabharathi ITC, page 1-10. IEEE, (2006)
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A Study of Implication Based Pseudo Functional Testing.
Manan Syal, Kameshwar Chandrasekar, Vishnu C. Vimjam, Michael S. Hsiao, Yi-Shing Chang, and Sreejit Chakravarty ITC, page 1-10. IEEE, (2006)
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Detection of Internal Stuck-open Faults in Scan Chains.
Fan Yang, Sreejit Chakravarty, Narendra Devta-Prasanna, Sudhakar M. Reddy, and Irith Pomeranz ITC, page 1-10. IEEE, (2008)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Testing of latch based embedded arrays using scan tests.
Fan Yang, and Sreejit Chakravarty ITC, page 104-113. IEEE, (2010)
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Optimal manufacturing flow to determine minumum operating voltage.
Sreejit Chakravarty, Binh Dang, Darcy Escovedo, and A. J. Haas ITC, page 1-10. IEEE, (2011)
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An llVM backend for GHC.
David A. Terei, and Manuel M. T. Chakravarty Haskell, page 109-120. ACM, (2010)
to dblp by dblp and 1 other user on Jan 13, 2012, 12:00 AM
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A Process Monitor Based Speed Binning and Die Matching Algorithm.
Sreejit Chakravarty Asian Test Symposium, page 311-316. IEEE Computer Society, (2011)
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A PSO based integrated functional link net and interval type-2 fuzzy logic system for predicting stock market indices.
S. Chakravarty, and P. K. Dash Appl. Soft Comput. 12(2):931-941 (2012)
to dblp by dblp on Jan 3, 2012, 12:00 AM
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4×2Gbps Source-Synchronous Transmitter in 45nm CMOS.
Anant S. Kamath, Vikas Sinha, and Sujoy Chakravarty VLSI Design, page 1-5. IEEE, (2011)
to dblp by dblp on Dec 29, 2011, 12:00 AM
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Fault Simulation ofIDDQ Tests for Bridging Faults in Sequential Circuits.
Paul J. Thadikaran, Sreejit Chakravarty, and Janak H. Patel FTCS, page 340-349. IEEE Computer Society, (1995)
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Application of Fourier Transform to Get an Original Satellite Image without Applying the SRM or 180 Degree Rotation.
Subhasis Kesh, and Srishty Chakravarty FGIT-SIP, volume 260 of Communications in Computer and Information Science, page 48-55. Springer, (2011)
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Visualization and Modeling of Geophysical Data.
G. Celniker, I. Chakravarty, and J. Moorman IEEE Visualization, page 362-365. IEEE Computer Society, (1993)
to dblp by dblp on Nov 30, 2011, 12:00 AM
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Offline Signature Recognition.
Indrani Chakravarty Encyclopedia of Data Warehousing and Mining, IGI Global, (2009)
to dblp by dblp on Nov 25, 2011, 12:00 AM
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Online Signature Recognition.
Indrani Chakravarty Encyclopedia of Data Warehousing and Mining, IGI Global, (2009)
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