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Anti-Pseudo-Gray Coding for VQ Encoded Images over Noisy Channels.
Hsien-Wen Tseng, and Chin-Chen Chang IEEE Communications Letters 11(5):443-445 (2007)
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A new technique for reducing MAC address overheads in sensor networks.
Kwan-Wu Chin, Darryn Lowe, and Ricardo Gandia Sanchez IEEE Communications Letters 10(5):338-340 (2006)
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Modified legendre sequences for optical CDMA-based passive optical networks.
Chao-Chin Yang IEEE Communications Letters 10(5):393-395 (2006)
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On the Selection of Partial Cancellation Factors for a Hard-Decision Partial PIC Scheme in DS-CDMA Systems.
Chin-Liang Wang, and Chiuan-Hsu Chen IEEE Communications Letters 11(8):668-670 (2007)
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Improving Inter-server Fairness in Active Queue Management.
Hsien-Ming Wu, Chin-Chi Wu, and Woei Lin IEEE Communications Letters 11(11):910-912 (2007)
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Analysis and Comparison of Inter-Symbol/Frame Interference in Pulsed DS- and Hybrid DS/TH-UWB Communications.
Mohammad Azizur Rahman, Shigenobu Sasaki, Shahi Taphsir Islam, Tuncer Baykas, Chin-Sean Sum, Junyi Wang, Ryuhei Funada, Hiroshi Harada, and Shuzo Kato VTC Spring, IEEE, (2009)
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A novel multi-group exploiting modification direction method based on switch map.
Xing-Tian Wang, Chin-Chen Chang, Chia-Chun Lin, and MingChu Li Signal Processing 92(6):1525-1535 (2012)
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Multiple path sensitization for hierarchical circuit testing.
Chau-Chin Su, and Charles R. Kime ITC, page 152-161. IEEE Computer Society, (1990)
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Computer-aided design of pseudoexhaustive BIST for semiregular circuits.
Chau-Chin Su, and Charles R. Kime ITC, page 680-689. IEEE Computer Society, (1990)
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Functional Testing of Circuits and SMD Boards with Limited Nodal Access.
Kenneth R. Chin ITC, page 129-143. IEEE Computer Society, (1989)
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Fault Location in Repairable Programmable Logic Arrays.
Chin-Long Wey ITC, page 679-685. IEEE Computer Society, (1989)
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Analysis and Detection of Timing Failures in an Experimental Test Chip.
Piero Franco, Siyad C. Ma, Jonathan Chang, Yi-Chin Chu, Sanjay Wattal, Edward J. McCluskey, Robert L. Stokes, and William D. Farwell ITC, page 691-700. IEEE Computer Society, (1996)
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Test Generation and Concurrent Error Detection in Current-Mode A/D Converters.
Shoba Krishnan, Sondes Sahli, and Chin-Long Wey ITC, page 312-320. IEEE Computer Society, (1992)
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Extreme-voltage stress vector generation of analog CMOS ICs for gate-oxide reliability enhancement.
Mohammad Athar Khalil, and Chin-Long Wey ITC, page 348-357. IEEE Computer Society, (2001)
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An Automatic Method for Selecting the Parameter of the Normalized Kernel Function to Support Vector Machines.
Cheng-Hsuan Li, Hsin-Hua Ho, Yu-Lung Liu, Chin-Teng Lin, Bor-Chen Kuo, and Jin-Shiuh Taur J. Inf. Sci. Eng. 28(1):1-15 (2012)
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Mutual information-based selection of optimal spatial-temporal patterns for single-trial EEG-based BCIs.
Kai Keng Ang, Zhengyang Chin, Haihong Zhang, and Cuntai Guan Pattern Recognition 45(6):2137-2144 (2012)
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Object tracking by exploiting adaptive region-wise linear subspace representations and adaptive templates in an iterative particle filter.
Ming-Che Ho, Cheng-Chin Chiang, and Ying-Yu Su Pattern Recognition Letters 33(5):500-512 (2012)
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Diagnosis for MRAM write disturbance fault.
Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Ji-Jan Chen, Wen Ching Wu, Chien-Chung Hung, and Ming-Jer Kao ITC, page 1-9. IEEE, (2007)
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Rapid UHF RFID silicon debug and production testing.
Udaya Shankar Natarajan, Hemalatha Shanmugasundaram, Prachi Deshpande, and Chin Soon Wah ITC, page 1-10. IEEE, (2007)
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Mask versus Schematic - an enhanced design-verification flow for first silicon success.
Tseng-Chin Luo, Eric Leong, Mango Chia-Tso Chao, Philip A. Fisher, and Wen-Hsiang Chang ITC, page 369-377. IEEE, (2010)
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