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publications

(2)

• Analyses on NVM Circuitry Delay Induced by Source & Drain BF2 Implant.
  P. Caprara and A. Barcella and M. Beltramello and C. Brambilla and S. Cereda and C. Caimi and V. Contin and V. Daniele and M. Fontana and P. Lucarno Microelectronics Reliability 42 1509-1511 (2002)
  to dblp by dblp on 2007-03-25 00:00:00
  | URL | BibTeX  
• Video Quality Experts Group: current results and future directions.
  Ann M. Rohaly and Philip J. Corriveau and John M. Libert and Arthur A. Webster and Vittorio Baroncini and John Beerends and Jean-Louis Blin and Laura Contin and Takahiro Hamada and David Harrison and Andries P. Hekstra and Jeffrey Lubin and Yukihiro Nishida and Ricardo Nishihara and John C. Pearson and Antonio F. Pessoa and Neil Pickford and Alexander Schertz and Massimo Visca and Andrew B. Watson and Stefan Winkler VCIP 742-753 (2000)
  to dblp by dblp on 2004-11-05 00:00:00
  | URL | BibTeX