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Crémer
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(5)
tags
dblp
No matching items.
Correlation, independence, and Bayesian incentives.
Claude d'Aspremont
,
Jacques Crémer
, and
Louis-André Gérard-Varet
.
Social Choice and Welfare
21(2):281-310
(
2003
)
Claude d'Aspremont
,
Jacques Crémer
, and
Louis-André Gérard-Varet
.
Social Choice and Welfare
21(2):281-310
(
2003
)
a year ago
by
dblp
1
dblp
dblp
URL
DOI
TeX
Balanced Bayesian mechanisms.
Claude d'Aspremont
,
Jacques Crémer
, and
Louis-André Gérard-Varet
.
J. Economic Theory
115(2):385-396
(
2004
)
Claude d'Aspremont
,
Jacques Crémer
, and
Louis-André Gérard-Varet
.
J. Economic Theory
115(2):385-396
(
2004
)
a year ago
by
dblp
1
dblp
dblp
URL
DOI
TeX
Optimal search auctions.
Jacques Crémer
,
Yossi Spiegel
, and
Charles Zhoucheng Zheng
.
J. Economic Theory
134(1):226-248
(
2007
)
Jacques Crémer
,
Yossi Spiegel
, and
Charles Zhoucheng Zheng
.
J. Economic Theory
134(1):226-248
(
2007
)
a year ago
by
dblp
1
dblp
dblp
URL
DOI
TeX
Electrical properties in low temperature range 5K-300K of Tantalum Oxide dielectric MIM capacitors.
E. Deloffre
,
L. Montès
,
G. Ghibaudo
,
S. Bruyère
,
S. Blonkowski
,
S. Bécu
,
M. Gros-Jean
, and
S. Crémer
.
Microelectronics Reliability
45(5-6):925-928
(
2005
)
E. Deloffre
,
L. Montès
,
G. Ghibaudo
,
S. Bruyère
,
S. Blonkowski
,
S. Bécu
,
M. Gros-Jean
, and
S. Crémer
.
Microelectronics Reliability
45(5-6):925-928
(
2005
)
6 years and 2 months ago
by
dblp
1
dblp
dblp
URL
DOI
TeX
MIM capacitance variation under electrical stress.
C. Besset
,
S. Bruyère
,
S. Blonkowski
,
S. Crémer
, and
E. Vincent
.
Microelectronics Reliability
43(8):1237-1240
(
2003
)
C. Besset
,
S. Bruyère
,
S. Blonkowski
,
S. Crémer
, and
E. Vincent
.
Microelectronics Reliability
43(8):1237-1240
(
2003
)
6 years and 3 months ago
by
dblp
1
dblp
dblp
URL
DOI
TeX
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