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publications

(4)

• A New Laser System for X-Rays Flashes Sensitivity Evaluation.
  D. Lewis and Hervé Lapuyade and Yann Deval and Y. Maidon and F. Darracq and R. Briand and P. Fouillat IOLTW 111- (2001)
  to dblp by dblp on 2008-03-11 00:00:00
  | URL | BibTeX  
• Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects.
  F. Darracq and Hervé Lapuyade and N. Buard and P. Fouillat and R. Dufayel and T. Carriere Microelectronics Reliability 43 1615-1619 (2003)
  to dblp by dblp on 2008-03-11 00:00:00
  | URL | BibTeX  
• Application of various optical techniques for ESD defect localization.
  F. Essely and F. Darracq and V. Pouget and M. Remmach and Felix Beaudoin and N. Guitard and M. Bafleur and Philippe Perdu and A. Touboul and D. Lewis Microelectronics Reliability 46 1563-1568 (2006)
  to dblp by dblp on 2007-03-27 00:00:00
  | URL | BibTeX  
• Complexity Analysis for Certain Convex Programming Problems.
  Marie-Cécile Darracq J. Complexity 15 282-293 (1999)
  to dblp by dblp on 2005-11-15 00:00:00
  | URL | BibTeX