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publications

(38)

• Diagnosis of Full Open Defects in Interconnecting Lines.
  Rosa Rodríguez-Montañés and Daniel Arumí and Joan Figueras and Stefan Eichenberger and Camelia Hora and Bram Kruseman and Maurice Lousberg and Ananta K. Majhi VTS 158-166 (2007)
  to dblp by dblp on 2008-05-07 00:00:00
  | URL | BibTeX  
• Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
  Daniel Arumí and Rosa Rodríguez-Montañés and Joan Figueras and Stefan Eichenberger and Camelia Hora and Bram Kruseman and Maurice Lousberg and Ananta K. Majhi VTS 145-150 (2007)
  to dblp by dblp on 2008-05-07 00:00:00
  | URL | BibTeX  
• Full Open Defects in Nanometric CMOS.
  Daniel Arumí and Rosa Rodríguez-Montañés and Joan Figueras and Stefan Eichenberger and Camelia Hora and Bram Kruseman VTS 119-124 (2008)
  to dblp by dblp on 2008-05-07 00:00:00
  | URL | BibTeX  
• To harmonize or to compete?: That's not the question
  Bruno S. Frey and Reiner Eichenberger Journal of Public Economics 60 335--349 (1996)
  to Tax harmonization by smicha on 2008-04-28 13:05:01
  | URL | BibTeX  
• On the rate of return in the art market: Survey and evaluation
  Bruno S. Frey and Reiner Eichenberger European Economic Review 39 528--537 (1995)
  to Cultural economics by smicha on 2008-04-28 13:05:01
  | URL | BibTeX  
• The Old Lady Visits Your Backyard: A Tale of Morals and Markets
  Bruno S. Frey and Felix Oberholzer-Gee and Reiner Eichenberger Journal of Political Economy 104 1297 (1996)
  to imported by smicha on 2008-04-24 23:09:04
  | URL | BibTeX  
• Memory Testing Under Different Stress Conditions: An Industrial Evaluation
  Ananta K. Majhi and Mohamed Azimane and Guido Gronthoud and Maurice Lousberg and Stefan Eichenberger and Fred Bowen CoRR abs/0710.4693 (2007)
  to dblp by dblp on 2008-01-02 00:00:00
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• Systematic Defects in Deep Sub-Micron Technologies.
  Bram Kruseman and Ananta K. Majhi and Camelia Hora and Stefan Eichenberger and Johan Meirlevede ITC 290-299 (2004)
  to dblp by dblp on 2006-09-21 00:00:00
  | URL | BibTeX  
• On Hazard-free Patterns for Fine-delay Fault Testing.
  Bram Kruseman and Ananta K. Majhi and Guido Gronthoud and Stefan Eichenberger ITC 213-222 (2004)
  to dblp by dblp on 2006-09-21 00:00:00
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• Using advanced compiler technology to exploit the performance of the Cell Broadband EngineTM architecture.
  Alexandre E. Eichenberger and Kevin O'Brien and Kathryn M. O'Brien and Peng Wu and Tong Chen and Peter H. Oden and Daniel A. Prener and Janice C. Shepherd and Byoungro So and Zehra Sura and Amy Wang and Tao Zhang and Peng Zhao and Michael Gschwind and Roch Archambault and Yaoqing Gao and Roland Koo IBM Systems Journal 45 59-84 (2006)
  to dblp by dblp on 2006-07-14 00:00:00
  | URL | BibTeX