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Design for Manufacturability - or the meaning of 'subtle'.
Stefan Eichenberger ITC, page 1316. IEEE Computer Society, (2003)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Power Supply Noise in Delay Testing.
Jing Wang 0006, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, and Stefan Eichenberger ITC, page 1-10. IEEE, (2006)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Architecture, implementation and parallelisation of the GROMOS software for biomolecular simulation.
Nathan Schmid, Clara D. Christ, Markus Christen, Andreas P. Eichenberger, and Wilfred F. van Gunsteren Computer Physics Communications 183(4):890-903 (2012)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs.
Friedrich Hapke, Rene Krenz-Baath, Andreas Glowatz, Jürgen Schlöffel, Hamidreza Hashempour, Stefan Eichenberger, Camelia Hora, and Dan Adolfsson ITC, page 1-10. IEEE, (2009)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, and Bram Kruseman ITC, page 1-10. IEEE, (2008)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality.
Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, and Ananta K. Majhi ITC, page 1-10. IEEE, (2008)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Defect-oriented cell-internal testing.
Friedrich Hapke, Wilfried Redemund, Jürgen Schlöffel, Rene Krenz-Baath, Andreas Glowatz, Michael Wittke, Hamidreza Hashempour, and Stefan Eichenberger ITC, page 285-294. IEEE, (2010)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Efficient Edge Profiling for ILP-Processors.
Alexandre E. Eichenberger, and S. M. Lobo IEEE PACT, page 294-. IEEE Computer Society, (1998)
to dblp by dblp on Jan 3, 2012, 12:00 AM
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Algorithms for Total Weighted Completion Time Scheduling.
Ivan D. Baev, Waleed Meleis, and Alexandre E. Eichenberger SODA, page 852-853. ACM/SIAM, (1999)
to dblp by dblp on Dec 23, 2011, 12:00 AM
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Memory Testing Under Different Stress Conditions: An Industrial Evaluation
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, and Fred Bowen CoRR (2007)
to dblp by dblp on Dec 5, 2011, 12:00 AM
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Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.
Daniel Arumí, Rosa Rodríguez Montanes, Joan Figueras, Stefan Eichenberger, Camelia Hora, and Bram Kruseman IEEE Trans. on CAD of Integrated Circuits and Systems 30(12):1911-1922 (2011)
to dblp by dblp on Nov 23, 2011, 12:00 AM
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Gate Leakage Impact on Full Open Defects in Interconnect Lines.
Daniel Arumí, Rosa Rodríguez Montanes, Joan Figueras, Stefan Eichenberger, Camelia Hora, and Bram Kruseman IEEE Trans. VLSI Syst. 19(12):2209-2220 (2011)
to dblp by dblp on Nov 3, 2011, 12:00 AM
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Counting electrons one by one-overview of a joint European research project.
Helko E. van den Brom, Oswin Kerkhof, Sergey V. Lotkhov, Sergey. A. Bogoslovsky, Gerd-Dietmar Willenberg, Hansjörg Scherer, Alexander B. Zorin, S. Pedersen, C. Kristoffersson, A. Aassime, Per Delsing, Marian A. Taslakov, Z. Ivanov, Håkan Nilsson, Stephen P. Giblin, Peter Kleinschmidt, Christian Hof, Ali L. Eichenberger, Frédéric Overney, Blaise Jeanneret, Gérard Genevès, Nicolas Feltin, Laurent Devoille, Frederic Gay, and François P. M. Piquemal IEEE T. Instrumentation and Measurement 52(2):584-589 (2003)
to dblp by dblp on Aug 4, 2011, 12:00 AM
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The OFMET Watt balance: Progress report.
Walter Beer, Ali L. Eichenberger, Blaise Jeanneret, Beat Jeckelmann, P. Richard H. Schneiter, Ali R. Pourzand, A. Courteville, and R. Dändliker IEEE T. Instrumentation and Measurement 50(2):583-586 (2001)
to dblp by dblp on Aug 4, 2011, 12:00 AM
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Manipulating single electrons with a seven-junction pump.
Christian Hof, Blaise Jeanneret, Ali L. Eichenberger, Frédéric Overney, Mark W. Keller, and M. J. Dalberth IEEE T. Instrumentation and Measurement 54(2):670-672 (2005)
to dblp by dblp on Jun 14, 2011, 12:00 AM
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Status of the METAS watt balance experiment.
Walter Beer, Ali L. Eichenberger, Blaise Jeanneret, Beat Jeckelmann, Ali R. Pourzand, Philippe Richard, and Joshua P. Schwarz IEEE T. Instrumentation and Measurement 52(2):626-630 (2003)
to dblp by dblp on Jun 14, 2011, 12:00 AM
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First steps toward a quantum capacitance standard at METAS.
Christian Hof, Blaise Jeanneret, Ali L. Eichenberger, Frédéric Overney, and Sergey V. Lotkhov IEEE T. Instrumentation and Measurement 52(2):604-607 (2003)
to dblp by dblp on Jun 14, 2011, 12:00 AM
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An Experimental Study of Algorithms for Weighted Completion Time Scheduling.
Ivan D. Baev, Waleed Meleis, and Alexandre E. Eichenberger Algorithmica 33(1):34-51 (2002)
to dblp by dblp on May 18, 2011, 12:00 AM
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Impact of Temperature on Test Quality.
Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, and V. Kamakoti VLSI Design, page 276-281. IEEE, (2010)
to dblp by dblp on Aug 11, 2010, 12:00 AM
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Compact multi-dimensional kernel extraction for register tiling.
Lakshminarayanan Renganarayanan, Uday Bondhugula, Salem Derisavi, Alexandre E. Eichenberger, and Kevin O'Brien SC, ACM, (2009)
to dblp by dblp on Jul 21, 2010, 4:12 PM
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