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bookmarks

publications

(7)

• PSAT: Proactive Signaling Architecture for IP Traceback.
  Ahmad Fadlallah and Ahmed Serhrouchni CNSR 293-299 (2006)
  to dblp by dblp on 2007-05-23 00:00:00
  | URL | BibTeX  
• Low voltage SILC and P- and N-MOSFET gate oxide reliability.
  C. Petit and A. Meinertzhagen and D. Zander and O. Simonetti and M. Fadlallah and T. Maurel Microelectronics Reliability 45 479-485 (2005)
  to dblp by dblp on 2007-03-27 00:00:00
  | URL | BibTeX  
• Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs.
  M. Fadlallah and G. Ghibaudo and J. Jomaah and M. Zoaeter and G. Guégan Microelectronics Reliability 42 41-46 (2002)
  to dblp by dblp on 2007-03-26 00:00:00
  | URL | BibTeX  
• Influence of nitradation in ultra-thin oxide on the gate current degradation of N and PMOS devices.
  M. Fadlallah and C. Petit and A. Meinertzhagen and G. Ghibaudo and M. Bidaud and O. Simonetti and F. Guyader Microelectronics Reliability 43 1433-1438 (2003)
  to dblp by dblp on 2007-03-25 00:00:00
  | URL | BibTeX  
• Low frequency noise and reliability properties pf 0.12 mum CMOS devices with Ta2O5 as gate dielectrics.
  M. Fadlallah and A. Szewczyk and C. Giannakopoulos and B. Cretu and F. Monsieur and T. Devoivre and J. Jomaah and G. Ghibaudo Microelectronics Reliability 41 1361-1366 (2001)
  to dblp by dblp on 2007-03-25 00:00:00
  | URL | BibTeX  
• A signaling architecture against dos attacks.
  Ahmad Fadlallah and Ahmed Serhrouchni ICETE 216-221 (2005)
  to dblp by dblp on 2006-11-07 00:00:00
  | URL | BibTeX  
• Parallel Computing Environments and Methods.
  Ghassan Fadlallah and Michel Lavoie and Louis-A. Dessaint PARELEC 2-7 (2000)
  to dblp by dblp on 2004-04-26 00:00:00
  | URL | BibTeX