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Defect detection and modelling using pulsed electrical stress for reliability investigations of InGaP HBT.

Cezary Sydlo and Bastian Mottet and Husin Ganis and Hans L. Hartnagel and Viktor Krozer and S. L. Delage and Simone Cassette and Eric Chartier and D. Floriot and Steven Bland Microelectronics Reliability 41 1567-1571 (2001)
to dblp by dblp on 2007-03-25 00:00:00
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