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IC Outlier Identification Using Multiple Test Metrics.
Sagar S. Sabade, and Duncan M. Hank Walker IEEE Design & Test of Computers 22(6):586-595 (2005)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Reliable energy efficient routing in wireless sensor networks.
Eunjae Jung, and Duncan M. Hank Walker MASS, IEEE, (2005)
to dblp by dblp on Aug 28, 2011, 12:00 AM
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Compact Delay Test Generation with a Realistic Low Cost Fault Coverage Metric.
Zheng Wang, and Duncan M. Hank Walker VTS, page 59-64. IEEE Computer Society, (2009)
to dblp by dblp on Mar 21, 2011, 12:00 AM
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Modeling Power Supply Noise in Delay Testing.
Jing Wang 0006, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, and Stefan Eichenberger IEEE Design & Test of Computers 24(3):226-234 (2007)
to dblp by dblp on Nov 25, 2009, 12:00 AM
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Test quality and yield analysis using the DEFAM defect to fault mapper.
Dinesh D. Gaitonde, and Duncan M. Hank Walker ICCAD, page 202-205. IEEE Computer Society, (1993)
to dblp by dblp on Sep 13, 2006, 12:00 AM
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DVLASIC: catastrophic fault yield simulation in a distributed processing environment.
Duncan M. Hank Walker, and D. S. Nydick IEEE Trans. on CAD of Integrated Circuits and Systems 9(6):655-664 (1990)
to dblp by dblp on Jun 20, 2006, 12:00 AM
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Semiconductor wafer representation for TCAD.
Martin D. Giles, Duane S. Boning, Goodwin R. Chin, Walter C. Dietrich Jr., Michael S. Karasick, Mark E. Law, Purnendu K. Mozumder, Lee R. Nackman, V. T. Rajan, Duncan M. Hank Walker, Robert H. Wang, and Alexander S. Wong IEEE Trans. on CAD of Integrated Circuits and Systems 13(1):82-95 (1994)
to dblp by dblp on May 31, 2006, 12:00 AM
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ITC 2003 Roundtable: Design for Manufacturability.
Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, and Hank Walker IEEE Design & Test of Computers 21(2):144-156 (2004)
to dblp by dblp on Nov 8, 2004, 12:00 AM
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