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Bayesian inference for PCFGs via Markov chain Monte Carlo
M. Johnson, T. L. Griffiths, and S. Goldwater Proceedings of the North American Conference on Computational Linguistics NAACL '07, (2007)
to inference grammar bayesian MCMC by sidyr and 3 other users on Feb 8, 2012, 1:08 PM
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A Bridge between American and European Options: The Ämeripean" Delayed-Exercise Model.
Paul V. Johnson, Nicholas J. Sharp, Peter W. Duck, and David P. Newton SIAM J. Financial Math. 2(1):965-988 (2011)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Convergence of Hill's Method for Nonselfadjoint Operators.
Mathew A. Johnson, and Kevin Zumbrun SIAM J. Numerical Analysis 50(1):64-78 (2012)
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Computing the obstacle number of a plane graph
Matthew P. Johnson, and Deniz Sariöz CoRR (2011)
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Your best might not be good enough: Ranking in collaborative social search engines.
Prantik Bhattacharyya, Jeff Rowe, Shyhtsun Felix Wu, Karen Zita Haigh, Niklas Lavesson, and Henric Johnson CollaborateCom, page 87-94. IEEE, (2011)
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More is More: The Benefits of Denser Sensor Deployment.
Matthew P. Johnson, Deniz Sariöz, Amotz Bar-Noy, Theodore Brown, Dinesh C. Verma, and Chai Wah Wu INFOCOM, page 379-387. IEEE, (2009)
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More is more: The benefits of dense sensor deployment.
Amotz Bar-Noy, Theodore Brown, Matthew P. Johnson, Deniz Sariöz, Dinesh C. Verma, and Chai Wah Wu MASS, page 514-515. IEEE, (2008)
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Testability Features in the TMS370 Family of Microcomputers.
Theo J. Powell, Fred Hwang, and Bill Johnson ITC, page 153-160. IEEE Computer Society, (1988)
to dblp by dblp and 1 other user on Feb 8, 2012, 12:00 AM
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Is DFT right for you?
Jim Johnson ITC, page 1090-1097. IEEE Computer Society, (1999)
to dblp by dblp and 1 other user on Feb 8, 2012, 12:00 AM
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Integrating Automated Diagnosis into the Testing and Failure Analysis Operations.
Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Jones, and Jayashree Saxena ITC, page 934. IEEE Computer Society, (1996)
to dblp by dblp and 1 other user on Feb 8, 2012, 12:00 AM
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A General Purpose ATE Based IDDQ Measurement Circuit.
Gerald H. Johnson, and Jan B. Wilstrup ITC, page 97-105. IEEE Computer Society, (1995)
to dblp by dblp and 1 other user on Feb 8, 2012, 12:00 AM
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Residual Charge on the Faulty Floating Gate MOS Transistor.
Simon Johnson ITC, page 555-561. IEEE Computer Society, (1994)
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Testing the Tester: Specification and Validation Approaches.
John C. Johnson ITC, page 29. IEEE Computer Society, (2002)
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Cost Containment for High-Volume Test of Multi-GB/s Ports.
John C. Johnson ITC, page 1308. IEEE Computer Society, (2003)
to dblp by dblp and 1 other user on Feb 8, 2012, 12:00 AM
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Challenges of high supply currents during VLSI test.
Gerald H. Johnson ITC, page 1013-1020. IEEE Computer Society, (2000)
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E-Mail Prioritization using Online Social Network Profile Distance.
Shaliz Rezaee, Niklas Lavesson, and Henric Johnson IJCSA 9(1):70-87 (2012)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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At-Speed Structural Test For High-Performance ASICs.
Vikram Iyengar, Toshihiko Yokota, Kazuhiro Yamada, Theo Anemikos, Bob Bassett, Mike Degregorio, Rudy Farmer, Gary Grise, Mark Johnson, Dave Milton, Mark Taylor, and Frank Woytowich ITC, page 1-10. IEEE, (2006)
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Structural Testing of High-Speed Serial Buses: A Case Study Analysis.
Eric Johnson ITC, page 1-9. IEEE, (2006)
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Blind, adaptive channel shortening by sum-squared auto-correlation minimization SAM.
Jaiganesh Balakrishnan, Richard K. Martin, and C. Richard Johnson Jr. IEEE Transactions on Signal Processing 51(12):3086-3093 (2003)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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The Importance of Functional-Like Access for Memory Test.
Jonathan Phelps, Chuck Johnson, Corey Goodrich, and Aman Kokrady ITC, page 1. IEEE, (2008)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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