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publications

(6)

• Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design.
  Antonis Papanikolaou and Miguel Miranda and Hua Wang and Francky Catthoor and M. Satyakiran and Pol Marchal and Ben Kaczer and C. Bruynseraede and Zsolt Tokei VLSI-SoC 342-347 (2006)
  to dblp by dblp on 2008-08-13 00:00:00
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• FinFET and MOSFET preliminary comparison of gate oxide reliability.
  R. Fernández and R. Rodríguez and M. Nafría and X. Aymerich and B. Kaczer and G. Groeseneken Microelectronics Reliability 46 1608-1611 (2006)
  to dblp by dblp on 2007-03-27 00:00:00
  | URL | BibTeX  
• Progressive breakdown in ultrathin SiON dielectrics and its effect on transistor performance.
  Robert O'Connor and Greg Hughes and Robin Degraeve and Ben Kaczer Microelectronics Reliability 45 869-874 (2005)
  to dblp by dblp on 2007-03-27 00:00:00
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• A new method for the analysis of high-resolution SILC data.
  S. Aresu and W. De Ceuninck and G. Knuyt and J. Mertens and J. Manca and L. De Schepper and Robin Degraeve and Ben Kaczer and M. D'Olieslaeger and J. D'Haen Microelectronics Reliability 43 1483-1488 (2003)
  to dblp by dblp on 2007-03-27 00:00:00
  | URL | BibTeX  
• High-resolution SILC measurements of thin SiO2 at ultra low voltages.
  S. Aresu and W. De Ceuninck and R. Dreesen and K. Croes and E. Andries and J. Manca and L. De Schepper and Robin Degraeve and Ben Kaczer and M. D'Olieslaeger Microelectronics Reliability 42 1485-1489 (2002)
  to dblp by dblp on 2007-03-27 00:00:00
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• Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study.
  Ben Kaczer and Robin Degraeve and M. Rasras and A. De Keersgieter and K. Van de Mieroop and Guido Groeseneken Microelectronics Reliability 42 555-564 (2002)
  to dblp by dblp on 2007-03-27 00:00:00
  | URL | BibTeX