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Transient current testing of 0.25 /spl mu/m CMOS devices.
Bram Kruseman, Peter Janssen, and Victor Zieren ITC, page 47-56. IEEE Computer Society, (1999)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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The future of delta I_DDQ testing.
Bram Kruseman, Rudger van Veen, and Kees van Kaam ITC, page 101-110. IEEE Computer Society, (2001)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Power Supply Noise in Delay Testing.
Jing Wang 0006, D. M. H. Walker, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul van de Wiel, and Stefan Eichenberger ITC, page 1-10. IEEE, (2006)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Time-dependent Behaviour of Full Open Defects in Interconnect Lines.
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, and Bram Kruseman ITC, page 1-10. IEEE, (2008)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality.
Stefan Eichenberger, Jeroen Geuzebroek, Camelia Hora, Bram Kruseman, and Ananta K. Majhi ITC, page 1-10. IEEE, (2008)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Defect Oriented Testing for analog/mixed-signal devices.
Bram Kruseman, Bratislav Tasic, Camelia Hora, Jos Dohmen, Hamidreza Hashempour, Maikel van Beurden, and Yizi Xing ITC, page 1-10. IEEE, (2011)
to dblp by dblp on Feb 2, 2012, 12:00 AM
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A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices.
Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, and Said Hamdioui DFT, page 139-145. IEEE, (2011)
to dblp by dblp on Dec 27, 2011, 12:00 AM
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Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out.
Daniel Arumí, Rosa Rodríguez Montanes, Joan Figueras, Stefan Eichenberger, Camelia Hora, and Bram Kruseman IEEE Trans. on CAD of Integrated Circuits and Systems 30(12):1911-1922 (2011)
to dblp by dblp on Nov 23, 2011, 12:00 AM
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Gate Leakage Impact on Full Open Defects in Interconnect Lines.
Daniel Arumí, Rosa Rodríguez Montanes, Joan Figueras, Stefan Eichenberger, Camelia Hora, and Bram Kruseman IEEE Trans. VLSI Syst. 19(12):2209-2220 (2011)
to dblp by dblp on Nov 3, 2011, 12:00 AM
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A Functional LR Parser.
René Leermakers, Lex Augusteijn, and F. E. J. Kruseman Aretz Theor. Comput. Sci. 104(2):313-323 (1992)
to dblp by dblp on Sep 7, 2011, 12:00 AM
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Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example.
Hamidreza Hashempour, Jos Dohmen, Bratislav Tasic, Bram Kruseman, Camelia Hora, Maikel van Beurden, and Yizi Xing DATE, page 371-376. IEEE, (2011)
to dblp by dblp on Sep 2, 2011, 12:00 AM
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On Deriving a LISP Program From Its Specification.
F. E. J. Kruseman Aretz Sci. Comput. Program. 10(1):19-32 (1988)
to dblp by dblp on Aug 30, 2011, 12:00 AM
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A New Approach to Earley's Parsing Algorithm.
F. E. J. Kruseman Aretz Sci. Comput. Program. 12(2):105-121 (1989)
to dblp by dblp on Aug 30, 2011, 12:00 AM
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On a Recursive Ascent Parser.
F. E. J. Kruseman Inf. Process. Lett. 29(4):201-206 (1988)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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Diagnosis of full open defects in interconnect lines with fan-out.
Rosa Rodriguez-Montañés, Daniel Arumí, Joan Figueras, S. Einchenberger, Camelia Hora, and Bram Kruseman European Test Symposium, page 233-238. IEEE Computer Society, (2010)
to dblp by dblp on Aug 16, 2010, 12:00 AM
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Impact of Temperature on Test Quality.
Lavanya Jagan, Camelia Hora, Bram Kruseman, Stefan Eichenberger, Ananta K. Majhi, and V. Kamakoti VLSI Design, page 276-281. IEEE, (2010)
to dblp by dblp on Aug 11, 2010, 12:00 AM
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NIM- a noise index model to estimate delay discrepancies between silicon and simulation.
Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, and Paul van de Wiel DATE, page 1373-1376. IEEE, (2010)
to dblp by dblp on Jul 21, 2010, 3:58 PM
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Syntax diagrams for ISO Pascal standard.
F. E. J. Kruseman Aretz SIGPLAN Notices 17(10):73-78 (1982)
to dblp by dblp on Feb 1, 2010, 12:00 AM
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Modeling Power Supply Noise in Delay Testing.
Jing Wang 0006, Duncan M. Hank Walker, Xiang Lu, Ananta K. Majhi, Bram Kruseman, Guido Gronthoud, Luis Elvira Villagra, Paul J. A. M. van de Wiel, and Stefan Eichenberger IEEE Design & Test of Computers 24(3):226-234 (2007)
to dblp by dblp on Nov 25, 2009, 12:00 AM
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Full Open Defects in Nanometric CMOS.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, and Bram Kruseman VTS, page 119-124. IEEE Computer Society, (2008)
to dblp by dblp on May 7, 2008, 12:00 AM
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