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Static component interconnect test technology SCITT a new technology for assembly testing.
Alex S. Biewenga, Henk D. L. Hollmann, Frans de Jong, and Maurice Lousberg ITC, page 439-448. IEEE Computer Society, (1999)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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A structured and scalable mechanism for test access to embedded reusable cores.
Erik Jan Marinissen, Robert G. J. Arendsen, Gerard Bos, Hans Dingemanse, Maurice Lousberg, and Clemens Wouters ITC, page 284-293. IEEE Computer Society, (1998)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Wrapper design for embedded core test.
Yervant Zorian, Erik Jan Marinissen, Maurice Lousberg, and Sandeep Kumar Goel ITC, page 911-920. IEEE Computer Society, (2000)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
Will R. Moore, Guido Gronthoud, Keith Baker, and Maurice Lousberg ITC, page 95-104. IEEE Computer Society, (2000)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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CTL the language for describing core-based test.
Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, and Douglas Kay ITC, page 131-139. IEEE Computer Society, (2001)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Memory Testing Under Different Stress Conditions: An Industrial Evaluation
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, and Fred Bowen CoRR (2007)
to dblp by dblp on Dec 5, 2011, 12:00 AM
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On IEEE P1500's Standard for Embedded Core Test.
Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, and Yervant Zorian J. Electronic Testing 18(4-5):365-383 (2002)
to dblp by dblp on Mar 22, 2009, 12:00 AM
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On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up.
Camelia Hora, Rene Segers, Stefan Eichenberger, and Maurice Lousberg J. Electronic Testing 19(4):369-376 (2003)
to dblp by dblp on Mar 22, 2009, 12:00 AM
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Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages.
Daniel Arumí, Rosa Rodríguez-Montañés, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, and Ananta K. Majhi VTS, page 145-150. IEEE Computer Society, (2007)
to dblp by dblp on May 7, 2008, 12:00 AM
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Diagnosis of Full Open Defects in Interconnecting Lines.
Rosa Rodríguez-Montañés, Daniel Arumí, Joan Figueras, Stefan Eichenberger, Camelia Hora, Bram Kruseman, Maurice Lousberg, and Ananta K. Majhi VTS, page 158-166. IEEE Computer Society, (2007)
to dblp by dblp on May 7, 2008, 12:00 AM
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IEEE Std 1500 Compliant Infrastructure forModular SOC Testing.
Tom Waayers, Erik Jan Marinissen, and Maurice Lousberg Asian Test Symposium, page 450. IEEE Computer Society, (2005)
to dblp by dblp on Mar 14, 2006, 12:00 AM
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A New Algorithm for Dynamic Faults Detection in RAMs.
Mohamed Azimane, Ananta K. Majhi, Guido Gronthoud, and Maurice Lousberg VTS, page 177-182. IEEE Computer Society, (2005)
to dblp by dblp on Jan 23, 2006, 12:00 AM
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Memory Testing Under Different Stress Conditions: An Industrial Evaluation.
Ananta K. Majhi, Mohamed Azimane, Guido Gronthoud, Maurice Lousberg, Stefan Eichenberger, and Fred Bowen DATE, page 438-443. IEEE Computer Society, (2005)
to dblp by dblp on Apr 13, 2005, 12:00 AM
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IP and Automation to Support IEEE P1500.
Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, and Mike Ricchetti VTS, page 411-412. IEEE Computer Society, (2001)
to dblp by dblp on Jul 8, 2004, 12:00 AM
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Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.
Ananta K. Majhi, Guido Gronthoud, Camelia Hora, Maurice Lousberg, Pop Valer, and Stefan Eichenberger VTS, page 345-350. IEEE Computer Society, (2003)
to dblp by dblp on Jul 6, 2004, 12:00 AM
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An Effective Diagnosis Method to Support Yield Improvement.
Camelia Hora, Rene Segers, Stefan Eichenberger, and Maurice Lousberg ITC, page 260-269. IEEE Computer Society, (2002)
to dblp by dblp on Jan 14, 2004, 12:00 AM
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