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Anaheim advanced traffic control system field operations test: A technical evaluation of SCOOT
J. E. Moore, S. P. Mattingly, C. A. MacCarley, and M. G. McNally Transportation Planning and Technology 28(6):465--482 (December 2005)
by atriana and 2 other users on Feb 14, 2012, 4:46 AM
DOI | BibTeX
Automatic creation of 3D environments from a single sketch using content-centric networks.
Theodoros Semertzidis, Petros Daras, Paul Moore, Lambros Makris, and Michael G. Strintzis IEEE Communications Magazine 49(3):152-157 (2011)
to dblp by dblp on Feb 13, 2012, 12:00 AM
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Blocking probability analysis for packet circuit emulation services.
Sean S. B. Moore IEEE Communications Letters 8(5):268-270 (2004)
to dblp by dblp on Feb 13, 2012, 12:00 AM
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Lessons learned from teaching reflective software engineering using the Leap toolkit.
Carleton A. Moore ICSE, page 672-675. (2000)
to dblp by dblp on Feb 10, 2012, 12:00 AM
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Regularity and strict identifiability in MIMO systems.
Terrence J. Moore, Brian M. Sadler, and Richard J. Kozick IEEE Transactions on Signal Processing 50(8):1831-1842 (2002)
to dblp by dblp on Feb 9, 2012, 12:00 AM
URL | BibTeX
ASIC BIST Synthesis: A VHDL Approach.
Tom Eberle, Robert McVay, Chris Meyers, and Jason Moore ITC, page 741-750. IEEE Computer Society, (1996)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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A Test Process Optimization and Cost Modeling Tool.
Timothy J. Moore ITC, page 103-110. IEEE Computer Society, (1994)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Multiple Fault Diagnosis in Printed Circuit Boards.
S. J. Barnfield, and W. R. Moore ITC, page 662-671. IEEE Computer Society, (1993)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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A Workstation Environment for Boundary Scan Interconnect Testing.
Timothy J. Moore ITC, page 1096-1103. IEEE Computer Society, (1991)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?
Will R. Moore, Guido Gronthoud, Keith Baker, and Maurice Lousberg ITC, page 95-104. IEEE Computer Society, (2000)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Collimator optimization for detection and quantitation tasks: application to gallium-67 imaging.
Stephen C. Moore, Marie Foley Kijewski, and G. E. Fakhri IEEE Trans. Med. Imaging 24(10):1347-1356 (2005)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Improved Regional Activity Quantitation in Nuclear Medicine Using a New Approach to Correct for Tissue Partial Volume and Spillover Effects.
Stephen C. Moore, Sudeepti Southekal, Mi-Ae Park, Sarah J. McQuaid, Marie Foley Kijewski, and Stefan P. Muller IEEE Trans. Med. Imaging 31(2):405-416 (2012)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Robotic grasping and manipulation through human visuomotor learning.
Brian Moore, and Erhan Oztop Robotics and Autonomous Systems 60(3):441-451 (2012)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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A novel stuck-at based method for transistor stuck-open fault diagnosis.
Xinyue Fan, Will R. Moore, Camelia Hora, and Guido Gronthoud ITC, page 9. IEEE, (2005)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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High throughput non-contact SiP testing.
Brian Moore, Chris Sellathamby, Philippe Cauvet, Hérvé Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, and Steven Slupsky ITC, page 1-10. IEEE, (2007)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Comparison of Delay Tests on Silicon.
Wangqi Qiu, D. M. H. Walker, Neil Simpson, Divya Reddy, and Anthony Moore ITC, page 1-10. IEEE, (2006)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Impact of decentralised control in cerebral blood flow auto-regulation using 1D and 3D models.
Katherine T. Moorhead, S. M. Moore, J. Geoffrey Chase, Timothy David, and J. Fink IJISTA 1(1/2):95-110 (2005)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Non-contact Testing for SoC and RCP SIPs at Advanced Nodes.
Brian Moore, Marc Mangrum, Chris Sellathamby, Md. Mahbub Reja, T. Weng, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, and Steven Slupsky ITC, page 1-10. IEEE, (2008)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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New tools and methodology for advanced parametric and defect structure test.
Raphael Robertazzi, Louis Medina, Ernesto Shiling, Garry Moore, Ronald Geiger, Jiun-Hsin Liao, and John Williamson ITC, page 19-28. IEEE, (2010)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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Tap, Move, Shake - Turning Your Game Ideas into iPhone and iPad Apps.
Todd Moore O'Reilly, (2012)
to dblp by dblp on Feb 3, 2012, 12:00 AM
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