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A One-Bit-Signature BIST for Embedded Operational Amplifiers in Mixed-Signal Circuits Based on the Slew-Rate Detection.
Iyad
Rayane
and Jaime
Velasco-Medina
and Michael
Nicolaidis
DATE
792- (1999)
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by
dblp
on 2008-09-04 00:00:00
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URL
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BibTeX
Fault Detection for Linear Analog Circuits Using Current Injection.
Jaime
Velasco-Medina
and Th.
Calin
and Michael
Nicolaidis
DATE
987- (1998)
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dblp
by
dblp
on 2008-09-04 00:00:00
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URL
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BibTeX
A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits.
Iyad
Rayane
and Jaime
Velasco-Medina
and Michael
Nicolaidis
VTS
304-310 (1999)
to
dblp
by
dblp
on 2008-09-04 00:00:00
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URL
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BibTeX
An Approach to the On-Line Testing of Operational Amplifiers.
Jaime
Velasco-Medina
and Marcelo
Lubaszewski
and Michael
Nicolaidis
Asian Test Symposium
290-295 (1998)
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by
dblp
on 2008-09-04 00:00:00
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URL
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BibTeX
On-Line BIST for Testing Analog Circuits.
Jaime
Velasco-Medina
and Iyad
Rayane
and Michael
Nicolaidis
ICCD
330- (1999)
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by
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on 2008-09-04 00:00:00
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URL
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BibTeX
A New Placement Algorithm Dedicated to Parallel Computers: Bases and Application.
Fabien
Clermidy
and Thierry
Collette
and Michael
Nicolaidis
PRDC
242- (1999)
to
dblp
by
dblp
on 2008-05-21 00:00:00
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URL
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BibTeX
Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors.
Michael
Nicolaidis
and Renaud
Perez
and Dan
Alexandrescu
VTS
371-376 (2008)
to
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by
dblp
on 2008-05-07 00:00:00
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URL
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BibTeX
Carry checking/parity prediction adders and ALUs.
Michael
Nicolaidis
IEEE Trans. VLSI Syst.
11
121-128 (2003)
to
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by
dblp
on 2007-11-13 00:00:00
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URL
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BibTeX
Testing complex couplings in multiport memories.
Michael
Nicolaidis
and Vladimir Castro
Alves
and H.
Bederr
IEEE Trans. VLSI Syst.
3
59-71 (1995)
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by
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on 2007-11-12 00:00:00
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URL
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BibTeX
Defects Tolerant Logic Gates for Unreliable Future Nanotechnologies.
Lorena
Anghel
and Michael
Nicolaidis
IWANN
422-429 (2007)
to
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by
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on 2007-09-24 00:00:00
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