sign in · help · news · about ·

BibSonomy :: author :: Papaioannou ::

tag user group author concept BibTeX key search:all

The blue social bookmark and publication sharing system.

>
|
<

bookmarks

bookmarks per page: 5 10 20 50 100

RSS BibTeX RDF more

publications

(141)

<< < 1 | 2 | 3 > >>

Accelerated lifetime test of RF-MEMS switches under ESD stress.
Jinyu Ruan, Nicolas Nolhier, G. J. Papaioannou, D. Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, and Robert Plana Microelectronics Reliability 49(9-11):1256-1259 (2009)
to dblp by dblp and 1 other user on Feb 14, 2012, 12:00 AM
URL | BibTeX
ESD failure signature in capacitive RF MEMS switches.
Jinyu Ruan, G. J. Papaioannou, Nicolas Nolhier, Nicolas Mauran, M. Bafleur, Fabio Coccetti, and Robert Plana Microelectronics Reliability 48(8-9):1237-1240 (2008)
to dblp by dblp and 1 other user on Feb 14, 2012, 12:00 AM
URL | BibTeX
Alpha particle radiation effects in RF MEMS capacitive switches.
Jinyu Ruan, E. Papandreou, M. Lamhamdi, M. Koutsoureli, Fabio Coccetti, Patrick Pons, George Papaioannou, and Robert Plana Microelectronics Reliability 48(8-9):1241-1244 (2008)
to dblp by dblp and 1 other user on Feb 14, 2012, 12:00 AM
URL | BibTeX
Cost-efficient and differentiated data availability guarantees in data clouds.
Nicolas Bonvin, Thanasis G. Papaioannou, and Karl Aberer ICDE, page 980-983. IEEE, (2010)
to dblp by dblp on Jan 23, 2012, 12:00 AM
URL | BibTeX
High quality elliptical texture filtering on GPU.
Pavlos Mavridis, and Georgios Papaioannou SI3D, page 23-30. ACM, (2011)
to dblp by dblp on Jan 5, 2012, 12:00 AM
URL | BibTeX
Educational additions to an Open Source Virtual Learning Environment VLE for the Greek Schools' Network.
Avgoustos A. Tsinakos, and Jon Papaioannou AICCSA, page 1019-1022. IEEE, (2006)
to dblp by dblp on Jan 5, 2012, 12:00 AM
URL | BibTeX
Structure dependent charging process in RF MEMS capacitive switches.
E. Papandreou, M. Lamhamdi, C. M. Skoulikidou, Patrick Pons, George Papaioannou, and Robert Plana Microelectronics Reliability 47(9-11):1812-1817 (2007)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Determination of bulk discharge current in the dielectric film of MEMS capacitive switches.
M. S. Koutsoureli, and G. J. Papaioannou Microelectronics Reliability 51(9-11):1874-1877 (2011)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation.
M. Lamhamdi, Patrick Pons, Usama Zaghloul, L. Boudou, Fabio Coccetti, J. Guastavino, Y. Segui, George Papaioannou, and Robert Plana Microelectronics Reliability 48(8-9):1248-1252 (2008)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Erratum to Ön the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies" MR 51/9-11 2011 1810-1818.
Usama Zaghloul, George Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, and Robert Plana Microelectronics Reliability 51(12):2416 (2011)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies.
Usama Zaghloul, George Papaioannou, Bharat Bhushan, Fabio Coccetti, Patrick Pons, and Robert Plana Microelectronics Reliability 51(9-11):1810-1818 (2011)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Kelvin probe microscopy for reliability investigation of RF-MEMS capacitive switches.
A. Belarni, M. Lamhamdi, Patrick Pons, L. Boudou, J. Guastavino, Y. Segui, George Papaioannou, and Robert Plana Microelectronics Reliability 48(8-9):1232-1236 (2008)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions.
Usama Zaghloul, George Papaioannou, Fabio Coccetti, Patrick Pons, and Robert Plana Microelectronics Reliability 49(9-11):1309-1314 (2009)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques.
Usama Zaghloul, M. Koutsoureli, H. Wang, Fabio Coccetti, George Papaioannou, Patrick Pons, and Robert Plana Microelectronics Reliability 50(9-11):1615-1620 (2010)
to dblp by dblp on Dec 19, 2011, 12:00 AM
URL | BibTeX
Effect of cell residence time variance on the performance of an advanced paging algorithm
Ioannis Z. Koukoutsidis, Petros I. Papaioannou, and Michael E. Theologou CoRR (2009)
to dblp by dblp on Dec 5, 2011, 12:00 AM
URL | BibTeX
Real-Time Diffuse Global Illumination Using Radiance Hints.
Georgios Papaioannou High Performance Graphics, page 15-24. Eurographics Association, (2011)
to dblp by dblp on Dec 5, 2011, 12:00 AM
URL | BibTeX
Global Illumination using Imperfect Volumes.
Pavlos Mavridis, and Georgios Papaioannou GRAPP, page 160-165. SciTePress, (2011)
to dblp by dblp on Nov 29, 2011, 12:00 AM
URL | BibTeX
Shortening Automated Negotiation Threads via Neural Nets.
Ioanna Roussaki, Ioannis V. Papaioannou, and Miltiades E. Anagnostou Encyclopedia of Artificial Intelligence, IGI Global, (2009)
to dblp by dblp on Nov 25, 2011, 12:00 AM
URL | BibTeX
A Survey on Neural Networks in Automated Negotiations.
Ioannis V. Papaioannou, Ioanna Roussaki, and Miltiades E. Anagnostou Encyclopedia of Artificial Intelligence, IGI Global, (2009)
to dblp by dblp on Nov 25, 2011, 12:00 AM
URL | BibTeX
Towards Online Multi-model Approximation of Time Series.
Thanasis G. Papaioannou, Mehdi Riahi, and Karl Aberer Mobile Data Management 1, page 33-38. IEEE, (2011)
to dblp by dblp on Nov 15, 2011, 12:00 AM
URL | BibTeX

<< < 1 | 2 | 3 > >>publications per page: 5 10 20 50 100