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publications

(38)

• Diagnosis of Realistic Defects Based on the X-Fault Model.
  Ilia Polian and Kohei Miyase and Yusuke Nakamura and Seiji Kajihara and Piet Engelke and Bernd Becker and Stefan Spinner and Xiaoqing Wen DDECS 263-266 (2008)
  to dblp by dblp on 2008-09-03 00:00:00
  | URL | BibTeX  
• A Definition and Classification of Timing Anomalies.
  Jan Reineke and Björn Wachter and Stephan Thesing and Reinhard Wilhelm and Ilia Polian and Jochen Eisinger and Bernd Becker WCET (2006)
  to dblp by dblp on 2008-05-09 00:00:00
  | URL | BibTeX  
• Automatic Test Pattern Generation for Interconnect Open Defects.
  Stefan Spinner and Ilia Polian and Piet Engelke and Bernd Becker and Martin Keim and Wu-Tung Cheng VTS 181-186 (2008)
  to dblp by dblp on 2008-05-07 00:00:00
  | URL | BibTeX  
• Electromechanical Reliability Testing of Three-Axial Silicon Force Sensors
  Stefan Spinner and J. Bartholomeyczik and Bernd Becker and M. Doelle and O. Paul and Ilia Polian and R. Roth and K. Seitz and P. Ruther CoRR abs/0711.3289 (2007)
  to dblp by dblp on 2008-05-07 00:00:00
  | URL | BibTeX  
• On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing.
  Piet Engelke and Ilia Polian and Michel Renovell and Sandip Kundu and Bharath Seshadri and Bernd Becker IEEE Trans. on CAD of Integrated Circuits and Systems 27 327-338 (2008)
  to dblp by dblp on 2008-04-08 00:00:00
  | URL | BibTeX  
• Functional Constraints vs. Test Compression in Scan-Based Delay Testing.
  Ilia Polian and Hideo Fujiwara J. Electronic Testing 23 445-455 (2007)
  to dblp by dblp on 2008-03-11 00:00:00
  | URL | BibTeX  
• Power Droop Testing.
  Ilia Polian and Alejandro Czutro and Sandip Kundu and Bernd Becker ICCD (2006)
  to dblp by dblp on 2008-02-08 00:00:00
  | URL | BibTeX  
• Evolutionary Optimization in Code-Based Test Compression
  Ilia Polian and Alejandro Czutro and Bernd Becker CoRR abs/0710.4670 (2007)
  to dblp by dblp on 2008-01-02 00:00:00
  | URL | BibTeX  
• Automatic Test Pattern Generation for Resistive Bridging Faults.
  Piet Engelke and Ilia Polian and Michel Renovell and Bernd Becker J. Electronic Testing 22 61-69 (2006)
  to dblp by dblp on 2007-09-18 00:00:00
  | URL | BibTeX  
• Modeling Feedback Bridging Faults with Non-Zero Resistance.
  Ilia Polian and Piet Engelke and Michel Renovell and Bernd Becker J. Electronic Testing 21 57-69 (2005)
  to dblp by dblp on 2007-09-18 00:00:00
  | URL | BibTeX