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publications

(58)

• An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing.
  A. Ney and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian and V. Gouin VTS 89-94 (2008)
  to dblp by dblp on 2008-05-07 00:00:00
  | URL | BibTeX  
• Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits.
  Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian J. Electronic Testing 23 435-444 (2007)
  to dblp by dblp on 2008-03-11 00:00:00
  | URL | BibTeX  
• Improving Diagnosis Resolution without Physical Information.
  Alexandre Rousset and Alberto Bosio and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel DELTA 210-215 (2008)
  to dblp by dblp on 2008-02-26 00:00:00
  | URL | BibTeX  
• Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles.
  Nabil Badereddine and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Christian Landrault VLSI-SoC 267-281 (2005)
  to dblp by dblp on 2007-11-07 00:00:00
  | URL | BibTeX  
• An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs.
  Patrick Girard and Olivier Héron and Serge Pravossoudovitch and Michel Renovell J. Electronic Testing 22 161-172 (2006)
  to dblp by dblp on 2007-09-18 00:00:00
  | URL | BibTeX  
• ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions.
  Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Simone Borri and Magali Bastian Hage-Hassan J. Electronic Testing 22 287-296 (2006)
  to dblp by dblp on 2007-09-18 00:00:00
  | URL | BibTeX  
• A Gated Clock Scheme for Low Power Testing of Logic Cores.
  Yannick Bonhomme and Patrick Girard and Loïs Guiller and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel J. Electronic Testing 22 89-99 (2006)
  to dblp by dblp on 2007-09-18 00:00:00
  | URL | BibTeX  
• Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.
  Simone Borri and Magali Bastian Hage-Hassan and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel J. Electronic Testing 21 169-179 (2005)
  to dblp by dblp on 2007-09-18 00:00:00
  | URL | BibTeX  
• Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs.
  Patrick Girard and Olivier Héron and Serge Pravossoudovitch and Michel Renovell J. Electronic Testing 21 43-55 (2005)
  to dblp by dblp on 2007-09-18 00:00:00
  | URL | BibTeX  
• Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories.
  Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Simone Borri and Magali Bastian Hage-Hassan J. Electronic Testing 21 551-561 (2005)
  to dblp by dblp on 2007-09-18 00:00:00
  | URL | BibTeX