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publications

(7)

• Single event burnout in power diodes: Mechanisms and models.
  A. M. Albadri and R. D. Schrimpf and K. F. Galloway and D. G. Walker Microelectronics Reliability 46 317-325 (2006)
  to dblp by dblp on 2007-03-27 00:00:00
  | URL | BibTeX  
• Single event transient effects in a voltage reference.
  P. C. Adell and R. D. Schrimpf and C. R. Cirba and W. T. Holman and X. Zhu and H. J. Barnaby and O. Mion Microelectronics Reliability 45 355-359 (2005)
  to dblp by dblp on 2007-03-27 00:00:00
  | URL | BibTeX  
• A generalized model for the lifetime of microelectronic components, applied to storage conditions.
  Loren J. Wise and Ronald D. Schrimpf and Harold G. Parks and Kenneth F. Galloway Microelectronics Reliability 41 317-322 (2001)
  to dblp by dblp on 2007-03-25 00:00:00
  | URL | BibTeX  
• Thermal modeling of single event burnout failure in semiconductor power devices.
  D. G. Walker and T. S. Fisher and J. Liu and R. D. Schrimpf Microelectronics Reliability 41 571-578 (2001)
  to dblp by dblp on 2007-03-25 00:00:00
  | URL | BibTeX  
• Compositional Semantics for UML 2.0 Sequence Diagrams Using Petri Nets.
  Christoph Eichner and Hans Fleischhack and Roland Meyer and Ulrik Schrimpf and Christian Stehno SDL Forum 133-148 (2005)
  to dblp by dblp on 2005-06-06 00:00:00
  | URL | BibTeX  
• Integrierte Prozeß- und Kommunikationsplanung im verteilten Realzeit-Betriebssystem MDX.
  Harald Schrimpf and Walter Ameling PEARL 60-70 (1995)
  to dblp by dblp on 2002-01-03 00:00:00
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• Migration of Processes, Files, and Virtual Devices in the MDX Operating Systems.
  Harald Schrimpf Operating Systems Review 29 70-81 (1995)
  to dblp by dblp on 2002-01-03 00:00:00
  | URL | BibTeX