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Wildcards for lightweight information integration in virtual desktops
Rodolfo Stecher, Claudia Niederée, and Wolfgang Nejdl Proceeding of the 17th ACM conference on Information and knowledge management, page 797--806. New York, NY, USA, ACM, (2008)
to desktops information integration lightweight toread virtual by schmidt2 on Jul 20, 2011, 11:40 AM
URL | DOI | BibTeX
Wide range control of the sustaining voltage of electrostatic discharge protection elements realized in a smart power technology.
Harald Gossner, T. Müller-Lynch, Kai Esmark, and Matthias Stecher Microelectronics Reliability 41(3):385-393 (2001)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Sergey Bychikhin, Martin Litzenberger, R. Pichler, Dionyz Pogany, Erich Gornik, G. Groos, and Matthias Stecher Microelectronics Reliability 41(9-10):1501-1506 (2001)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.
M. Blaho, Dionyz Pogany, Erich Gornik, M. Denison, G. Groos, and Matthias Stecher Microelectronics Reliability 43(4):545-548 (2003)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Michael Heer, V. Dubec, M. Blaho, Sergey Bychikhin, Dionyz Pogany, Erich Gornik, M. Denison, Matthias Stecher, and G. Groos Microelectronics Reliability 45(9-11):1688-1693 (2005)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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Modeling and characterization of molding compound properties during cure.
Kaspar M. B. Jansen, C. Qian, Leo J. Ernst, C. Bohm, A. Kessler, H. Preu, and Matthias Stecher Microelectronics Reliability 49(8):872-876 (2009)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
G. Haberfehlner, Sergey Bychikhin, V. Dubec, Michael Heer, A. Podgaynaya, M. Pfost, Matthias Stecher, Erich Gornik, and Dionyz Pogany Microelectronics Reliability 49(9-11):1346-1351 (2009)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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System ESD robustness by co-design of on-chip and on-board protection measures.
Harald Gossner, Werner Simbürger, and Matthias Stecher Microelectronics Reliability 50(9-11):1359-1366 (2010)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization.
A. Podgaynaya, R. Rudolf, B. Elattari, Dionyz Pogany, Erich Gornik, Matthias Stecher, and M. Strasser Microelectronics Reliability 50(9-11):1347-1351 (2010)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing TLP.
Martin Sauter, Werner Simbürger, David Johnsson, and Matthias Stecher Microelectronics Reliability 51(8):1309-1314 (2011)
to dblp by dblp on Jul 8, 2011, 12:00 AM
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Boosting a Haar-Like Feature Set for Face Verification.
Bernhard Fröba, Sandra Stecher, and Christian Küblbeck AVBPA, volume 2688 of Lecture Notes in Computer Science, page 617-624. Springer, (2003)
to dblp by dblp on Jul 5, 2011, 12:00 AM
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Proposal for an Interface System Between the Business and Data Processing Systems.
P. Stecher Comput. J. 20(3):194-201 (1977)
to dblp by dblp on Jun 28, 2011, 12:00 AM
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The Application Controller Concept: A First Experience.
P. Stecher, and Volker Allenstein Comput. J. 24(2):97-106 (1981)
to dblp by dblp on Jun 28, 2011, 12:00 AM
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Generating Ambiguity in the Laboratory.
Jack Stecher, Timothy Shields, and John Dickhaut Management Science 57(4):705-712 (2011)
to dblp by dblp on Apr 26, 2011, 12:00 AM
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Reporting und Analyse mit SAP BusinessObjects
Norbert Egger, Klemens Hastenrath, Alexander Kästner, Sebastian Kramer, and Daniel Stecher Galileo Press, (June 2009)
to imported by tausendeins on Feb 8, 2011, 4:44 PM
BibTeX
Strategie und Struktur, oder: wie kommen SchülerInnen gut durch die Schule?
Sabine Maschke, and Ludwig Stecher Diskurs Kindheits- und Jugendforschung 1(4):497-516 (2006)
to Bourdieu,_Pierre Deutschland Erfahrung Jugendlicher Kind Lernen Nordrhein-Westfalen Realität Schule Schulklasse Schüler Schülerin Sekundarstufe_I Sekundarstufe_II Selbstbewusstsein Strategie Vergleich by pedocs on Dec 20, 2010, 7:29 PM
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Schulleistungen als Familienthema. Grundschülerinnen und Grundschüler in deutschen Familien
Ludwig Stecher Diskurs Kindheits- und Jugendforschung 1(2):217-228 (2006)
to Bildung Deutschland Eltern Familie Fremdeinschätzung Grundschule Kind Migrant Migration Schule Schulleistung Selbsteinschätzung Ungleichheit Zufriedenheit by pedocs on Dec 20, 2010, 7:29 PM
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Query Ranking in Information Integration.
Rodolfo Stecher, Stefania Costache, Claudia Niederée, and Wolfgang Nejdl CAiSE, volume 6051 of Lecture Notes in Computer Science, page 230-235. Springer, (2010)
to dblp by dblp on Sep 3, 2010, 12:00 AM
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Thin Slices of Online Profile Attributes.
Kristin Brooke Stecher, and Scott Counts ICWSM, The AAAI Press, (2008)
to dblp by dblp on Sep 1, 2010, 12:00 AM
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Spontaneous Inference of Personality Traits and Effects on Memory for Online Profiles.
Kristin Brooke Stecher, and Scott Counts ICWSM, The AAAI Press, (2008)
to dblp by dblp on Sep 1, 2010, 12:00 AM
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