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A Regression Based Technique for ATE-Aware Test Data Volume Estimation of System-on-Chips.

Rajesh Tiwari and Abhijeet Shrivastava and Mahit Warhadpande and Srivaths Ravi and Rubin A. Parekhji VTS 53-58 (2008)
to dblp by dblp on 2008-05-07 00:00:00
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