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(22)
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Temperature-limited microprocessors: Measurements and design implications.
Hendrik F.
Hamann
and Alan J.
Weger
and James A.
Lacey
and Zhigang
Hu
and Pradip
Bose
and Erwin
Cohen
and Jamil A.
Wakil
VLSI Design
427-432 (2007)
to
dblp
by
dblp
on 2008-08-13 00:00:00
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URL
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BibTeX
Keeping hot chips cool: are IC thermal problems hot air?
Ruchir
Puri
and Devadas
Varma
and Darvin
Edwards
and Alan J.
Weger
and Paul
Franzon
and Andrew
Yang
and Stephen V.
Kosonocky
DAC
634-635 (2008)
to
dblp
by
dblp
on 2008-07-31 00:00:00
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URL
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BibTeX
Technologiemarketing für Großforschungseinrichtungen am Beispiel des Forschungszentrums Karlsruhe GmbH
{Christoph}
Weger
(1998)
to
imported
by
fbw
on 2008-05-29 13:01:59
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URL
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BibTeX
A dynamic Jahn-Teller theory for high-Tc superconductivity
M.
Weger
and R.
Englman
Physica A: Statistical and Theoretical Physics
168
324--337 (1990)
to
imported
by
smicha
on 2008-04-22 10:36:30
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URL
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BibTeX
Thermal-aware task scheduling at the system software level.
Jeonghwan
Choi
and Chen-Yong
Cher
and Hubertus
Franke
and Henrdrik
Hamann
and Alan
Weger
and Pradip
Bose
ISLPED
213-218 (2007)
to
dblp
by
dblp
on 2008-04-17 00:00:00
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URL
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BibTeX
Chosen-Prefix Collisions for MD5 and Colliding X.509 Certificates for Different Identities.
Marc
Stevens
and Arjen K.
Lenstra
and Benne de
Weger
EUROCRYPT
1-22 (2007)
to
dblp
by
dblp
on 2007-06-25 00:00:00
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URL
|
BibTeX
CMOS IC diagnostics using the luminescence of OFF-state leakage currents.
Stas
Polonsky
and Keith A.
Jenkins
and Alan J.
Weger
and Shinho
Cho
ITC
134-139 (2004)
to
dblp
by
dblp
on 2007-03-27 00:00:00
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URL
|
BibTeX
Optical and Electrical Testing of Latchup in I/O Interface Circuits.
Franco
Stellari
and Peilin
Song
and Moyra K.
McManus
and Robert
Gauthier
and Alan J.
Weger
and Kiran V.
Chatty
and Mujahid
Muhammad
and Pia
Sanda
ITC
236-245 (2003)
to
dblp
by
dblp
on 2007-03-27 00:00:00
|
URL
|
BibTeX
Photon emission microscopy of inter/intra chip device performance variations.
Stas
Polonsky
and M.
Bhushan
and A.
Gattiker
and Alan J.
Weger
and Peilin
Song
Microelectronics Reliability
45
1471-1475 (2005)
to
dblp
by
dblp
on 2007-03-27 00:00:00
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URL
|
BibTeX
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Romain
Desplats
and A.
Eral
and Felix
Beaudoin
and Philippe
Perdu
and Alan J.
Weger
and Moyra K.
McManus
and Peilin
Song
and Franco
Stellari
Microelectronics Reliability
43
1663-1668 (2003)
to
dblp
by
dblp
on 2007-03-25 00:00:00
|
URL
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BibTeX
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