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High-speed electrical testing of multichip ceramic modules.

Dennis G. Manzer and John P. Karidis and Kathleen M. Wiley and Dominic C. Bruen and Christopher W. Cline and Charles Hendricks and Robert N. Wiggin and Yuet-Ying Yu IBM Journal of Research and Development 49 687-698 (2005)
to dblp by dblp on 2006-09-05 00:00:00
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