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Diameter-Selective Raman Scattering from Vibrational Modes in Carbon Nanotubes
A. M. Rao, E. Richter, Shunji Bandow, Bruce Chase, P. C. Eklund, K. A. Williams, S. Fang, K. R. Subbaswamy, M. Menon, A. Thess, R. E. Smalley, G. Dresselhaus, and M. S. Dresselhaus Science 275(5297):187-191 (1997)
to Heat-Transfer-Solids Heat-Transfer by fhrleroy and 1 other user on Feb 14, 2012, 3:05 PM
URL | DOI | BibTeX
A Statistical Study of De-Embedding Applied to Eye Diagram Analysis.
Paul D. Hale, Jeffrey A. Jargon, Chih-Ming Jack Wang, Brett Grossman, Mathew Claudius, José L. Torres, Andrew Dienstfrey, and Dylan F. Williams IEEE T. Instrumentation and Measurement 61(2):475-488 (2012)
to dblp by dblp on Feb 13, 2012, 12:00 AM
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Errors in testing.
Richard H. Williams, and Charles F. Hawkins ITC, page 1018-1027. IEEE Computer Society, (1990)
to dblp by dblp on Feb 9, 2012, 12:00 AM
URL | BibTeX
What is community informatics?: a global and empirical answer.
Kate Williams, Shameem Ahmed, Noah Lenstra, and Qiyuan Liu iConference, page 598-600. ACM, (2012)
to dblp by dblp on Feb 9, 2012, 12:00 AM
URL | BibTeX
Finding Small Unsatisfiable Cores to Prove Unsatisfiability of QBFs.
Yannet Interian, Gabriel Corvera, Bart Selman, and Ryan Williams ISAIM, (2006)
to dblp by dblp on Feb 9, 2012, 12:00 AM
URL | BibTeX
2D Phase Diagram for Minimizers of a Cahn-Hilliard Functional with Long-Range Interactions.
Rustum Choksi, Mirjana Maras, and J. F. Williams SIAM J. Applied Dynamical Systems 10(4):1344-1362 (2011)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Design for Testability of Mixed Signal Integrated Circuits.
Kenneth D. Wagner, and Thomas W. Williams ITC, page 823-828. IEEE Computer Society, (1988)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Statistical Delay Fault Coverage and Defect Level for Delay Faults.
Eun Sei Park, Thomas W. Williams, and M. Ray Mercer ITC, page 492-499. IEEE Computer Society, (1988)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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PC manufacturing test in a high volume environment.
David Williams ITC, page 698-704. IEEE Computer Society, (1999)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Detection of CMOS address decoder open faults with March and pseudo random memory tests.
Jan Otterstedt, Dirk Niggemeyer, and T. W. Williams ITC, page 53-62. IEEE Computer Society, (1998)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
IDDQ Test: Sensitivity Analysis of Scaling.
Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, and Wojciech Maly ITC, page 786-792. IEEE Computer Society, (1996)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Using Target Faults To Detect Non-Tartget Defects.
Li-C. Wang, M. Ray Mercer, and Thomas W. Williams ITC, page 629-638. IEEE Computer Society, (1996)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
A Discussion of Methods for Measuring Low-Amplitude Jitter.
Michael K. Williams ITC, page 646-652. IEEE Computer Society, (1995)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
On Efficiently and Reliably Achieving Low Defective Part Levels.
Li-C. Wang, M. Ray Mercer, and Thomas W. Williams ITC, page 616-625. IEEE Computer Society, (1995)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Design of an Efficient Weighted-Random-Pattern Generation System.
Rohit Kapur, Srinivas Patil, Thomas J. Snethen, and Thomas W. Williams ITC, page 491-500. IEEE Computer Society, (1994)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
The Economics of Guardband Placement.
Richard H. Williams, and Charles F. Hawkins ITC, page 218-225. IEEE Computer Society, (1993)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Delay Test: The Next Frontier for LSSD Test Systems.
Bernd Könemann, J. Barlow, Paul Chang, R. Gabrielson, C. Goertz, Brion L. Keller, Kevin McCauley, J. Tischer, Vijay S. Iyengar, Barry K. Rosen, and T. Williams ITC, page 578-587. IEEE Computer Society, (1992)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Economic Impact of Type I Test Errors at System and Board Levels.
Christopher L. Henderson, Richard H. Williams, and Charles F. Hawkins ITC, page 444-452. IEEE Computer Society, (1992)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Testing Errors: Data and Calculations in an IC Manufacturing Process.
Richard H. Williams, R. Glenn Wagner, and Charles F. Hawkins ITC, page 352-361. IEEE Computer Society, (1992)
to dblp by dblp on Feb 8, 2012, 12:00 AM
URL | BibTeX
Integrating Emulation Techniques into General Purpose ATE.
R. Wade Williams ITC, page 994-1003. IEEE Computer Society, (1991)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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