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• Characterisation of the Al2O3 films deposited by ultrasonic spray pyrolysis and atomic layer deposition methods for passivation of 4H-SiC devices.
  Maciej Wolborski and Mietek Bakowski and Armando Ortiz and Viljami Pore and Adolf Schöner and Mikko Ritala and Markku Leskelä and Anders Hallén Microelectronics Reliability 46 743-755 (2006)
  to dblp by dblp on 2007-03-27 00:00:00
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