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Four-Component Scattering Power Decomposition With Extended Volume Scattering Model.
Akinobu Sato, Yoshio Yamaguchi, Gulab Singh, and Sang-Eun Park IEEE Geosci. Remote Sensing Lett. 9(2):166-170 (2012)
to dblp by dblp on Feb 13, 2012, 12:00 AM
URL | BibTeX
Potential assessment of SAR in compact and full polarimetry mode for snow detection.
Gulab Singh, Yoshio Yamaguchi, G. Venktaraman, and Sang-Eun Park IGARSS, page 2286-2289. IEEE, (2011)
to dblp by dblp and 1 other user on Feb 13, 2012, 12:00 AM
URL | BibTeX
Hyperspectral image compression suitable for spectral analysis application.
Kazuma Shinoda, Yukio Kosugi, Yuri Murakami, Masahiro Yamaguchi, and Nagaaki Ohyama PCS, page 74-77. IEEE, (2010)
to dblp by dblp on Feb 10, 2012, 12:00 AM
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Design of signature circuits based on weight distributions of error-correcting codes.
Kazuhiko Iwasaki, and Noboru Yamaguchi ITC, page 779-785. IEEE Computer Society, (1990)
to dblp by dblp on Feb 9, 2012, 12:00 AM
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A study of an FPGA based flexible SIMD processor.
Shoji Tanabe, Takuya Nagashima, and Yoshiki Yamaguchi SIGARCH Computer Architecture News 39(4):86-89 (2011)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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An Efficient Method for Compressing Test Data.
Takahiro J. Yamaguchi, Masahiro Ishida, Marco Tilgner, and Dong Sam Ha ITC, page 79-88. IEEE Computer Society, (1997)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Dynamic Testing of ADCs Using Wavelet Transforms.
Takahiro J. Yamaguchi, and Mani Soma ITC, page 379-388. IEEE Computer Society, (1997)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Multi-GHz interface devices should be tested using external test resources.
Takahiro J. Yamaguchi ITC, page 1229. IEEE Computer Society, (2002)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Open Architecture ATE and 250 Consecutive UIs.
Takahiro J. Yamaguchi ITC, page 1307. IEEE Computer Society, (2003)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Jitter measurements of a PowerPCTM microprocessor using an analytic signal method.
Takahiro J. Yamaguchi, Mani Soma, David Halter, Jim Nissen, Rajesh Raina, Masahiro Ishida, and Toshifumi Watanabe ITC, page 955-964. IEEE Computer Society, (2000)
to dblp by dblp on Feb 8, 2012, 12:00 AM
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Low-Profile Design of Metasurface Considering FSS Filtering Characteristics.
Yuki Kawakami, Toshikazu Hori, Mitoshi Fujimoto, Ryo Yamaguchi, and Keizo Cho IEICE Transactions 95-B(2):477-483 (2012)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Global Mapping Analysis: Stochastic Gradient Algorithm in Multidimensional Scaling.
Yoshitatsu Matsuda, and Kazunori Yamaguchi IEICE Transactions 95-D(2):596-603 (2012)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Clustering for Visual Analogue Scale Data in Symbolic Data Analysis.
Kotoe Katayama, Rui Yamaguchi, Seiya Imoto, Keiko Matsuura, Kenji Watanabe, and Satoru Miyano Procedia CS (2011)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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A wideband low-noise ATE-based method for measuring jitter in GHz signals.
Takahiro J. Yamaguchi, Masahiro Ishida, and Mani Soma ITC, page 10. IEEE, (2005)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time.
Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, and Mani Soma ITC, page 1-8. IEEE, (2007)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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Data jitter measurement using a delta-time-to-voltage converter method.
Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, and Mani Soma ITC, page 1-7. IEEE, (2007)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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A Real-Time Delta-Time-to-Voltage Converter for Clock Jitter Measurement.
Kiyotaka Ichiyama, Masahiro Ishida, Takahiro J. Yamaguchi, and Mani Soma ITC, page 1-8. IEEE, (2006)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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A Study of Per-Pin Timing Jitter Scope.
Takahiro J. Yamaguchi, Satoshi Iwamoto, Masahiro Ishida, and Mani Soma ITC, page 1-7. IEEE, (2006)
to dblp by dblp on Feb 7, 2012, 12:00 AM
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A robust method for identifying a deterministic jitter model in a total jitter distribution.
Takahiro J. Yamaguchi, Kiyotaka Ichiyama, X. H. Hou, and Masahiro Ishida ITC, page 1-10. IEEE, (2009)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing.
Takahiro J. Yamaguchi, Masayuki Kawabata, Mani Soma, Masahiro Ishida, K. Sawami, and Koichiro Uekusa ITC, page 1-9. IEEE, (2008)
to dblp by dblp on Feb 6, 2012, 12:00 AM
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