@inproceedings{conf/itc/MooreGBL00,
  added-at = {2012-02-08T00:00:00.000+0100},
  author = {Moore, Will R. and Gronthoud, Guido and Baker, Keith and Lousberg, Maurice},
  biburl = {http://www.bibsonomy.org/bibtex/20bf26f3672d025d393a1d30076903a4e/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2000},
  ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2000.894196},
  interhash = {7cc7f15e370a3f562b00f142db1195bc},
  intrahash = {0bf26f3672d025d393a1d30076903a4e},
  keywords = {dblp},
  pages = {95-104},
  publisher = {IEEE Computer Society},
  title = {Delay-fault testing and defects in deep sub-micron ICs-does critical resistance really mean anything?},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#MooreGBL00},
  year = 2000
}

@inproceedings{conf/itc/WangWMKGVWE06,
  added-at = {2012-02-08T00:00:00.000+0100},
  author = {0006, Jing Wang and Walker, D. M. H. and Majhi, Ananta K. and Kruseman, Bram and Gronthoud, Guido and Villagra, Luis Elvira and van de Wiel, Paul and Eichenberger, Stefan},
  biburl = {http://www.bibsonomy.org/bibtex/223e1c34f22f75bb7a8e9f1def646b3b5/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2006},
  editor = {Davidson, Scott and Gattiker, Anne},
  ee = {http://dx.doi.org/10.1109/TEST.2006.297642},
  interhash = {aab0685d17376eb1039f30450184dcdf},
  intrahash = {23e1c34f22f75bb7a8e9f1def646b3b5},
  isbn = {1-4244-0292-1},
  keywords = {dblp},
  pages = {1-10},
  publisher = {IEEE},
  title = {Power Supply Noise in Delay Testing.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2006.html#WangWMKGVWE06},
  year = 2006
}

@inproceedings{conf/itc/FanMHG05,
  added-at = {2012-02-07T00:00:00.000+0100},
  author = {Fan, Xinyue and Moore, Will R. and Hora, Camelia and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/273c7f9ac52b7cfa936286e7577e68456/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2005},
  ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583996},
  interhash = {84385e4c55805da318392b9b689deaf8},
  intrahash = {73c7f9ac52b7cfa936286e7577e68456},
  isbn = {0-7803-9038-5},
  keywords = {dblp},
  pages = 9,
  publisher = {IEEE},
  title = {A novel stuck-at based method for transistor stuck-open fault diagnosis.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2005.html#FanMHG05},
  year = 2005
}

@inproceedings{conf/itc/SilvaGG05,
  added-at = {2012-02-07T00:00:00.000+0100},
  author = {Silva, Estella and de Gyvez, José Pineda and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/213cb891579f6880c5fa02fdcde170693/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2005},
  ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584000},
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  intrahash = {13cb891579f6880c5fa02fdcde170693},
  isbn = {0-7803-9038-5},
  keywords = {dblp},
  pages = 9,
  publisher = {IEEE},
  title = {Functional vs. multi-VDD testing of RF circuits.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2005.html#SilvaGG05},
  year = 2005
}

@article{journals/corr/abs-0710-4693,
  added-at = {2011-12-05T00:00:00.000+0100},
  author = {Majhi, Ananta K. and Azimane, Mohamed and Gronthoud, Guido and Lousberg, Maurice and Eichenberger, Stefan and Bowen, Fred},
  biburl = {http://www.bibsonomy.org/bibtex/29b7d8a3b952fbddcdb326b52deeb4cfb/dblp},
  ee = {http://arxiv.org/abs/0710.4693},
  interhash = {7f3b713c6df7c525bcf363711b0c7318},
  intrahash = {9b7d8a3b952fbddcdb326b52deeb4cfb},
  journal = {CoRR},
  keywords = {dblp},
  title = {Memory Testing Under Different Stress Conditions: An Industrial Evaluation},
  url = {http://dblp.uni-trier.de/db/journals/corr/corr0710.html#abs-0710-4693},
  volume = {abs/0710.4693},
  year = 2007
}

@inproceedings{conf/ets/ZivkovicHGJ08,
  added-at = {2011-08-25T00:00:00.000+0200},
  author = {Zivkovic, Vladimir A. and van der Heyden, Frank and Gronthoud, Guido and de Jong, Frans},
  biburl = {http://www.bibsonomy.org/bibtex/2d687b674a7bce73fd783dd0163019298/dblp},
  booktitle = {European Test Symposium},
  crossref = {conf/ets/2008},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2008.18},
  interhash = {93af8efe43469bf7ec18bc04251829bf},
  intrahash = {d687b674a7bce73fd783dd0163019298},
  isbn = {978-0-7695-3150-2},
  keywords = {dblp},
  pages = {27-32},
  publisher = {IEEE Computer Society},
  title = {Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design.},
  url = {http://dblp.uni-trier.de/db/conf/ets/ets2008.html#ZivkovicHGJ08},
  year = 2008
}

@article{journals/iet-cdt/FanMHG07,
  added-at = {2011-06-22T00:00:00.000+0200},
  author = {Fan, Xinyue and Moore, Will R. and Hora, Camelia and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/23bf94cc44e8a943cc56bf332d9af2f83/dblp},
  ee = {http://dx.doi.org/10.1049/iet-cdt:20060206},
  interhash = {b95cca669bc256d9ecb096d32388f33c},
  intrahash = {3bf94cc44e8a943cc56bf332d9af2f83},
  journal = {IET Computers & Digital Techniques},
  keywords = {dblp},
  number = 6,
  pages = {685-693},
  title = {Extending gate-level diagnosis tools to CMOS intra-gate faults.},
  url = {http://dblp.uni-trier.de/db/journals/iet-cdt/iet-cdt1.html#FanMHG07},
  volume = 1,
  year = 2007
}

@inproceedings{conf/vts/FanMHKG06,
  added-at = {2011-06-22T00:00:00.000+0200},
  author = {Fan, Xinyue and Moore, Will R. and Hora, Camelia and Konijnenburg, Mario H. and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/24189f6964f30f0b71de36bfa1aee13ff/dblp},
  booktitle = {VTS},
  crossref = {conf/vts/2006},
  ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2006.6},
  interhash = {a260677f3ea7346113d8a4bc72399681},
  intrahash = {4189f6964f30f0b71de36bfa1aee13ff},
  isbn = {0-7695-2514-8},
  keywords = {dblp},
  pages = {266-271},
  publisher = {IEEE Computer Society},
  title = {A Gate-Level Method for Transistor-Level Bridging Fault Diagnosis.},
  url = {http://dblp.uni-trier.de/db/conf/vts/vts2006.html#FanMHKG06},
  year = 2006
}

@inproceedings{conf/ets/ShengKZG09,
  added-at = {2010-08-27T00:00:00.000+0200},
  author = {Sheng, Xiaoqin and Kerkhoff, Hans G. and Zjajo, Amir and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/200c75def88755e0dfbbf8e65874110d7/dblp},
  booktitle = {European Test Symposium},
  crossref = {conf/ets/2009},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2009.17},
  interhash = {c3bc1afec92c008b3f0b4ac86926e3f1},
  intrahash = {00c75def88755e0dfbbf8e65874110d7},
  isbn = {978-0-7695-3703-0},
  keywords = {dblp},
  pages = {45-50},
  publisher = {IEEE Computer Society},
  title = {Algorithms for ADC Multi-site Test with Digital Input Stimulus.},
  url = {http://dblp.uni-trier.de/db/conf/ets/ets2009.html#ShengKZG09},
  year = 2009
}

@article{journals/dt/WangWLMKGVWE07,
  added-at = {2009-11-25T00:00:00.000+0100},
  author = {0006, Jing Wang and Walker, Duncan M. Hank and Lu, Xiang and Majhi, Ananta K. and Kruseman, Bram and Gronthoud, Guido and Villagra, Luis Elvira and van de Wiel, Paul J. A. M. and Eichenberger, Stefan},
  biburl = {http://www.bibsonomy.org/bibtex/237c3a0cfa6bb80e53c094bb1310d3998/dblp},
  date = {2009-11-25},
  description = {dblp},
  ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2007.76},
  interhash = {708ad4784102ad5f1b1a66a4752c0d22},
  intrahash = {37c3a0cfa6bb80e53c094bb1310d3998},
  journal = {IEEE Design & Test of Computers},
  keywords = {dblp},
  number = 3,
  pages = {226-234},
  title = {Modeling Power Supply Noise in Delay Testing.},
  url = {http://dblp.uni-trier.de/db/journals/dt/dt24.html#WangWLMKGVWE07},
  volume = 24,
  year = 2007
}

@article{journals/et/GyvezGA05,
  added-at = {2007-09-18T00:00:00.000+0200},
  author = {de Gyvez, José Pineda and Gronthoud, Guido and Amine, Rashid},
  biburl = {http://www.bibsonomy.org/bibtex/2b9d92d0aa91a11e1e702a4eb410fcee1/dblp},
  date = {2007-09-18},
  description = {dblp},
  ee = {http://dx.doi.org/10.1007/s10836-005-6360-x},
  interhash = {cd4f78ed14e945aa19ca76e69617708b},
  intrahash = {b9d92d0aa91a11e1e702a4eb410fcee1},
  journal = {J. Electronic Testing},
  keywords = {dblp},
  number = 3,
  pages = {311-322},
  title = {Multi-VDD Testing for Analog Circuits.},
  url = {http://dblp.uni-trier.de/db/journals/et/et21.html#GyvezGA05},
  volume = 21,
  year = 2005
}

@article{journals/et/ZjajoGG06,
  added-at = {2007-09-18T00:00:00.000+0200},
  author = {Zjajo, Amir and de Gyvez, José Pineda and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/2b8b22b55779e62446b50ee043d779df4/dblp},
  date = {2007-09-18},
  description = {dblp},
  ee = {http://dx.doi.org/10.1007/s10836-006-9499-1},
  interhash = {b3ba8b2a9c16a4d48c59cdc516789ed8},
  intrahash = {b8b22b55779e62446b50ee043d779df4},
  journal = {J. Electronic Testing},
  keywords = {dblp},
  number = {4-6},
  pages = {399-409},
  title = {Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits.},
  url = {http://dblp.uni-trier.de/db/journals/et/et22.html#ZjajoGG06},
  volume = 22,
  year = 2006
}

@inproceedings{conf/date/AndersKG07,
  added-at = {2007-06-22T00:00:00.000+0200},
  author = {Anders, Jens and Krishnan, Shaji and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/20a399438651f48f67105d42faeb47fd8/dblp},
  booktitle = {DATE},
  crossref = {conf/date/2007},
  date = {2007-06-22},
  description = {dblp},
  editor = {Lauwereins, Rudy and Madsen, Jan},
  ee = {http://doi.acm.org/10.1145/1266366.1266518},
  interhash = {202a3686d749fd7ab3f2b2b6e6dfd92b},
  intrahash = {0a399438651f48f67105d42faeb47fd8},
  isbn = {978-3-9810801-2-4},
  keywords = {dblp},
  pages = {707-712},
  publisher = {ACM},
  title = {Re-configuration of sub-blocks for effective application of time domain tests.},
  url = {http://dblp.uni-trier.de/db/conf/date/date2007.html#AndersKG07},
  year = 2007
}

@inproceedings{conf/vts/KrusemanMG07,
  added-at = {2007-06-04T00:00:00.000+0200},
  author = {Kruseman, Bram and Majhi, Ananta K. and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/2b8154d17bedbe92ff85d7ff75910b5d8/dblp},
  booktitle = {VTS},
  crossref = {conf/vts/2007},
  date = {2007-06-04},
  description = {dblp},
  ee = {http://dx.doi.org/10.1109/VTS.2007.45},
  interhash = {400a4b94e9e6fef2f99ac07ff8aa5d11},
  intrahash = {b8154d17bedbe92ff85d7ff75910b5d8},
  keywords = {dblp},
  pages = {29-34},
  publisher = {IEEE Computer Society},
  title = {On Performance Testing with Path Delay Patterns.},
  url = {http://dblp.uni-trier.de/db/conf/vts/vts2007.html#KrusemanMG07},
  year = 2007
}

@inproceedings{conf/itc/KrusemanMGE04,
  added-at = {2006-09-21T00:00:00.000+0200},
  author = {Kruseman, Bram and Majhi, Ananta K. and Gronthoud, Guido and Eichenberger, Stefan},
  biburl = {http://www.bibsonomy.org/bibtex/211aedb746d44981daf8890ea8d6512c4/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2004},
  date = {2006-09-21},
  description = {dblp},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.128},
  interhash = {217c373c5dbfccef242754df1838153f},
  intrahash = {11aedb746d44981daf8890ea8d6512c4},
  isbn = {0-7803-8581-0},
  keywords = {dblp},
  pages = {213-222},
  publisher = {IEEE},
  title = {On Hazard-free Patterns for Fine-delay Fault Testing.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2004.html#KrusemanMGE04},
  year = 2004
}

@inproceedings{conf/itc/GyvezGCPBK04,
  added-at = {2006-09-21T00:00:00.000+0200},
  author = {de Gyvez, José Pineda and Gronthoud, Guido and Cenci, Cristiano and Posch, Martin and Burger, Thomas and Koller, Manfred},
  biburl = {http://www.bibsonomy.org/bibtex/2fcb33c235bcf91aa5aa2c516e7e03b3c/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2004},
  date = {2006-09-21},
  description = {dblp},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.142},
  interhash = {d3a4e1cd31702db6964360c5369f3971},
  intrahash = {fcb33c235bcf91aa5aa2c516e7e03b3c},
  isbn = {0-7803-8581-0},
  keywords = {dblp},
  pages = {980-987},
  publisher = {IEEE},
  title = {Power Supply Ramping for Quasi-static Testing of PLLs.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2004.html#GyvezGCPBK04},
  year = 2004
}

@inproceedings{conf/vts/AzimaneMGL05,
  added-at = {2006-01-23T00:00:00.000+0100},
  author = {Azimane, Mohamed and Majhi, Ananta K. and Gronthoud, Guido and Lousberg, Maurice},
  biburl = {http://www.bibsonomy.org/bibtex/20531af9f0ebbc6afe00a2a1dae7c2341/dblp},
  booktitle = {VTS},
  crossref = {conf/vts/2005},
  date = {2006-01-23},
  description = {dblp},
  ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.9},
  interhash = {2e1aad755ef6ab4a2900175bc62a5fa8},
  intrahash = {0531af9f0ebbc6afe00a2a1dae7c2341},
  isbn = {0-7695-2314-5},
  keywords = {dblp},
  pages = {177-182},
  publisher = {IEEE Computer Society},
  title = {A New Algorithm for Dynamic Faults Detection in RAMs.},
  url = {http://dblp.uni-trier.de/db/conf/vts/vts2005.html#AzimaneMGL05},
  year = 2005
}

@inproceedings{conf/date/MajhiAGLEB05,
  added-at = {2005-04-13T00:00:00.000+0200},
  author = {Majhi, Ananta K. and Azimane, Mohamed and Gronthoud, Guido and Lousberg, Maurice and Eichenberger, Stefan and Bowen, Fred},
  biburl = {http://www.bibsonomy.org/bibtex/225ad728e445693cf9b8d86bbfc32785d/dblp},
  booktitle = {DATE},
  crossref = {conf/date/2005},
  date = {2005-04-13},
  description = {dblp},
  ee = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.206},
  interhash = {ccda20d0491705b2cbfea47b3b4dadec},
  intrahash = {25ad728e445693cf9b8d86bbfc32785d},
  isbn = {0-7695-2288-2},
  keywords = {dblp},
  pages = {438-443},
  publisher = {IEEE Computer Society},
  title = {Memory Testing Under Different Stress Conditions: An Industrial Evaluation.},
  url = {http://dblp.uni-trier.de/db/conf/date/date2005.html#MajhiAGLEB05},
  year = 2005
}

@inproceedings{conf/vts/MajhiGHLVE03,
  added-at = {2004-07-06T00:00:00.000+0200},
  author = {Majhi, Ananta K. and Gronthoud, Guido and Hora, Camelia and Lousberg, Maurice and Valer, Pop and Eichenberger, Stefan},
  biburl = {http://www.bibsonomy.org/bibtex/282b33bdd3bc5214f870b238ef70fa484/dblp},
  booktitle = {VTS},
  crossref = {conf/vts/2003},
  date = {2004-07-06},
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  ee = {http://csdl.computer.org/comp/proceedings/vts/2003/1924/00/19240345abs.htm},
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  intrahash = {82b33bdd3bc5214f870b238ef70fa484},
  isbn = {0-7695-1924-5},
  keywords = {dblp},
  pages = {345-350},
  publisher = {IEEE Computer Society},
  title = {Improving Diagnostic Resolution of Delay Faults using Path Delay Fault Model.},
  url = {http://dblp.uni-trier.de/db/conf/vts/vts2003.html#MajhiGHLVE03},
  year = 2003
}

@inproceedings{conf/itc/GyvezGA03,
  added-at = {2004-02-25T00:00:00.000+0100},
  author = {de Gyvez, José Pineda and Gronthoud, Guido and Amine, Rashid},
  biburl = {http://www.bibsonomy.org/bibtex/2d455d63dc5670f7038417e7365901e66/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2003},
  date = {2004-02-25},
  description = {dblp},
  ee = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630651abs.htm},
  interhash = {29942477ced13f20610cbd10f795d9d2},
  intrahash = {d455d63dc5670f7038417e7365901e66},
  isbn = {0-7803-8106-8},
  keywords = {dblp},
  pages = {651-658},
  publisher = {IEEE Computer Society},
  title = {VDD Ramp Testing for RF Circuits.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#GyvezGA03},
  year = 2003
}