@inproceedings{conf/ddecs/BosioGPB08,
	title = {SoC Symbolic Simulation: a case study on delay fault testing.},
	author = {Alberto Bosio and Patrick Girard and Serge Pravossoudovitch and Paolo Bernardi},
	booktitle = {DDECS},
	crossref = {conf/ddecs/2008},
	editor = {Bernd Straube and Milos Drutarovský and Michel Renovell and Peter Gramata and Mária Fischerová},
	pages = {320-325},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/ddecs/ddecs2008.html#BosioGPB08},
	year = {2008},
	biburl = {http://www.bibsonomy.org/bibtex/2e4e3b4d443b5b25105ce4d58a92631cd/dblp},
	description = {dblp},
	date = {2008-09-03}, ee = {http://dx.doi.org/10.1109/DDECS.2008.4538810}, isbn = {978-1-4244-2276-0},
	keywords = {dblp }
}

@inproceedings{conf/vts/NeyGPVBG08,
	title = {An SRAM Design-for-Diagnosis Solution Based on Write Driver Voltage Sensing.},
	author = {A. Ney and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian and V. Gouin},
	booktitle = {VTS},
	crossref = {conf/vts/2008},
	pages = {89-94},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/vts/vts2008.html#NeyGPVBG08},
	year = {2008},
	biburl = {http://www.bibsonomy.org/bibtex/297025f4525e9a18a02bb3ac55c69910a/dblp},
	description = {dblp},
	ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.17}, date = {2008-05-07},
	keywords = {dblp }
}

@article{journals/et/DililloGPVB07,
	title = {Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits.},
	author = {Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian},
	journal = {J. Electronic Testing},
	number = {5},
	pages = {435-444},
	url = {http://dblp.uni-trier.de/db/journals/et/et23.html#DililloGPVB07},
	volume = {23},
	year = {2007},
	biburl = {http://www.bibsonomy.org/bibtex/2aaeaefee1f7d740a1bb6aff902c5943b/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1007/s10836-007-5003-9}, date = {2008-03-11},
	keywords = {dblp }
}

@inproceedings{conf/delta/RoussetBGLPV08,
	title = {Improving Diagnosis Resolution without Physical Information.},
	author = {Alexandre Rousset and Alberto Bosio and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel},
	booktitle = {DELTA},
	crossref = {conf/delta/2008},
	pages = {210-215},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/delta/delta2008.html#RoussetBGLPV08},
	year = {2008},
	biburl = {http://www.bibsonomy.org/bibtex/225c79f7c9bff15fb79475d01ee294bb1/dblp},
	description = {dblp},
	ee = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.37}, date = {2008-02-26},
	keywords = {dblp }
}

@inproceedings{conf/vlsi/BadereddineGPVL05,
	title = {Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles.},
	author = {Nabil Badereddine and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Christian Landrault},
	booktitle = {VLSI-SoC},
	crossref = {conf/vlsi/2005soc},
	editor = {Ricardo Augusto da Luz Reis and Adam Osseiran and Hans-Jörg Pfleiderer},
	pages = {267-281},
	publisher = {Springer},
	series = {IFIP},
	url = {http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2005.html#BadereddineGPVL05},
	volume = {240},
	year = {2005},
	biburl = {http://www.bibsonomy.org/bibtex/26c549b97ef4157515956e3de0d1f8f44/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1007/978-0-387-73661-7_17}, isbn = {978-0-387-73660-0}, date = {2007-11-07},
	keywords = {dblp }
}

@article{journals/et/GirardHPR06,
	title = {An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs.},
	author = {Patrick Girard and Olivier Héron and Serge Pravossoudovitch and Michel Renovell},
	journal = {J. Electronic Testing},
	number = {2},
	pages = {161-172},
	url = {http://dblp.uni-trier.de/db/journals/et/et22.html#GirardHPR06},
	volume = {22},
	year = {2006},
	biburl = {http://www.bibsonomy.org/bibtex/24d58bea29dde8f95ded51703b2a4a15a/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1007/s10836-005-4631-1}, date = {2007-09-18},
	keywords = {dblp }
}

@article{journals/et/DililloGPVBH06,
	title = {ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions.},
	author = {Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Simone Borri and Magali Bastian Hage-Hassan},
	journal = {J. Electronic Testing},
	number = {3},
	pages = {287-296},
	url = {http://dblp.uni-trier.de/db/journals/et/et22.html#DililloGPVBH06},
	volume = {22},
	year = {2006},
	biburl = {http://www.bibsonomy.org/bibtex/254a4f5a32b57ebdc2d15e5160dc4e3af/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1007/s10836-006-7761-1}, date = {2007-09-18},
	keywords = {dblp }
}

@article{journals/et/BonhommeGGLPV06,
	title = {A Gated Clock Scheme for Low Power Testing of Logic Cores.},
	author = {Yannick Bonhomme and Patrick Girard and Loïs Guiller and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel},
	journal = {J. Electronic Testing},
	number = {1},
	pages = {89-99},
	url = {http://dblp.uni-trier.de/db/journals/et/et22.html#BonhommeGGLPV06},
	volume = {22},
	year = {2006},
	biburl = {http://www.bibsonomy.org/bibtex/267cf0191e53b12c6d4796d8cc245bc98/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1007/s10836-006-6259-1}, date = {2007-09-18},
	keywords = {dblp }
}

@article{journals/et/BorriHDGPV05,
	title = {Analysis of Dynamic Faults in Embedded-SRAMs: Implications for Memory Test.},
	author = {Simone Borri and Magali Bastian Hage-Hassan and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel},
	journal = {J. Electronic Testing},
	number = {2},
	pages = {169-179},
	url = {http://dblp.uni-trier.de/db/journals/et/et21.html#BorriHDGPV05},
	volume = {21},
	year = {2005},
	biburl = {http://www.bibsonomy.org/bibtex/2c0a88e92fc09693dedaeb8195f6789ba/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1007/s10836-005-6146-1}, date = {2007-09-18},
	keywords = {dblp }
}

@article{journals/et/GirardHPR05,
	title = {Delay Fault Testing of Look-Up Tables in SRAM-Based FPGAs.},
	author = {Patrick Girard and Olivier Héron and Serge Pravossoudovitch and Michel Renovell},
	journal = {J. Electronic Testing},
	number = {1},
	pages = {43-55},
	url = {http://dblp.uni-trier.de/db/journals/et/et21.html#GirardHPR05},
	volume = {21},
	year = {2005},
	biburl = {http://www.bibsonomy.org/bibtex/2c8d146e8f0a8de61c29ba28d1e6f6703/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1007/s10836-005-5286-7}, date = {2007-09-18},
	keywords = {dblp }
}