@inproceedings{conf/vts/WohlWP07,
	title = {Automated Design and Insertion of Optimal One-Hot Bus Encoders.},
	author = {Peter Wohl and John A. Waicukauski and Sanjay Patel},
	booktitle = {VTS},
	crossref = {conf/vts/2007},
	pages = {409-415},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/vts/vts2007.html#WohlWP07},
	year = {2007},
	biburl = {http://www.bibsonomy.org/bibtex/2c6b9332a6658343afa178e15136293fc/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1109/VTS.2007.18}, date = {2008-01-24},
	keywords = {dblp }
}

@inproceedings{conf/vts/WohlWKRGWJ07,
	title = {Minimizing the Impact of Scan Compression.},
	author = {Peter Wohl and John A. Waicukauski and Rohit Kapur and S. Ramnath and Emil Gizdarski and Thomas W. Williams and P. Jaini},
	booktitle = {VTS},
	crossref = {conf/vts/2007},
	pages = {67-74},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/vts/vts2007.html#WohlWKRGWJ07},
	year = {2007},
	biburl = {http://www.bibsonomy.org/bibtex/27fce55c1cab1406651467d54791f1169/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1109/VTS.2007.38}, date = {2007-06-04},
	keywords = {dblp }
}

@article{journals/tcad/IyengarRW90,
	title = {On computing the sizes of detected delay faults.},
	author = {Vijay S. Iyengar and Barry K. Rosen and John A. Waicukauski},
	journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
	number = {3},
	pages = {299-312},
	url = {http://dblp.uni-trier.de/db/journals/tcad/tcad9.html#IyengarRW90},
	volume = {9},
	year = {1990},
	biburl = {http://www.bibsonomy.org/bibtex/2e6be3ba92bf06ff5f3ffca6cd571d376/dblp},
	description = {dblp},
	ee = {http://doi.ieeecomputersociety.org/10.1109/43.46805}, date = {2006-06-20},
	keywords = {dblp }
}

@inproceedings{conf/dac/WohlWP04,
	title = {Scalable selector architecture for x-tolerant deterministic BIST.},
	author = {Peter Wohl and John A. Waicukauski and Sanjay Patel},
	booktitle = {DAC},
	crossref = {conf/dac/2004},
	editor = {Sharad Malik and Limor Fix and Andrew B. Kahng},
	pages = {934-939},
	publisher = {ACM},
	url = {http://dblp.uni-trier.de/db/conf/dac/dac2004.html#WohlWP04},
	year = {2004},
	biburl = {http://www.bibsonomy.org/bibtex/27b0bcf6ff9134d8c5042de4270786ee2/dblp},
	description = {dblp},
	ee = {http://doi.acm.org/10.1145/996566.996814}, isbn = {1-58113-828-8}, date = {2006-02-10},
	keywords = {dblp }
}

@inproceedings{conf/dac/WohlWPA03,
	title = {Efficient compression and application of deterministic patterns in a logic BIST architecture.},
	author = {Peter Wohl and John A. Waicukauski and Sanjay Patel and Minesh B. Amin},
	booktitle = {DAC},
	crossref = {conf/dac/2003},
	pages = {566-569},
	publisher = {ACM},
	url = {http://dblp.uni-trier.de/db/conf/dac/dac2003.html#WohlWPA03},
	year = {2003},
	biburl = {http://www.bibsonomy.org/bibtex/276f1d0bd0dbcf70e74fb936954a9978f/dblp},
	description = {dblp},
	ee = {http://doi.acm.org/10.1145/775832.775976}, isbn = {1-58113-688-9}, date = {2006-02-10},
	keywords = {dblp }
}

@inproceedings{conf/vts/WohlWPHGM05,
	title = {Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST.},
	author = {Peter Wohl and John A. Waicukauski and Sanjay Patel and Cy Hay and Emil Gizdarski and Ben Mathew},
	booktitle = {VTS},
	crossref = {conf/vts/2005},
	pages = {359-365},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/vts/vts2005.html#WohlWPHGM05},
	year = {2005},
	biburl = {http://www.bibsonomy.org/bibtex/221bb858856e53874b2fde837c3675012/dblp},
	description = {dblp},
	ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2005.48}, isbn = {0-7695-2314-5}, date = {2006-01-23},
	keywords = {dblp }
}

@inproceedings{conf/vts/WohlWG96,
	title = {Testing "untestable" faults in three-state circuits.},
	author = {Peter Wohl and John A. Waicukauski and Matthew Graf},
	booktitle = {VTS},
	crossref = {conf/vts/1996},
	pages = {324-331},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/vts/vts1996.html#WohlWG96},
	year = {1996},
	biburl = {http://www.bibsonomy.org/bibtex/269efe0d572b4737e3f3445fd69e9a0d1/dblp},
	description = {dblp},
	ee = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040324abs.htm}, date = {2004-07-16},
	keywords = {dblp }
}

@inproceedings{conf/vts/WohlW97,
	title = {Using ATPG for clock rules checking in complex scan design.},
	author = {Peter Wohl and John A. Waicukauski},
	booktitle = {VTS},
	crossref = {conf/vts/1997},
	pages = {130-136},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/vts/vts1997.html#WohlW97},
	year = {1997},
	biburl = {http://www.bibsonomy.org/bibtex/206bbfd5a89c75b5e6e7db64b6d996cdb/dblp},
	description = {dblp},
	ee = {http://csdl.computer.org/comp/proceedings/vts/1997/7810/00/78100130abs.htm}, date = {2004-07-14},
	keywords = {dblp }
}

@inproceedings{conf/itc/WohlWPA03,
	title = {X-Tolerant Compression And Application of Scan-ATPG Patterns In A BIST Architecture.},
	author = {Peter Wohl and John A. Waicukauski and Sanjay Patel and Minesh B. Amin},
	booktitle = {ITC},
	crossref = {conf/itc/2003},
	pages = {727-736},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/itc/itc2003.html#WohlWPA03},
	year = {2003},
	biburl = {http://www.bibsonomy.org/bibtex/23f49c1ecc5b0db8b7afd63f2bd2e0246/dblp},
	description = {dblp},
	ee = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630727abs.htm}, isbn = {0-7803-8106-8}, date = {2004-02-25},
	keywords = {dblp }
}

@inproceedings{conf/itc/JainW02,
	title = {Scan Test Data Volume Reduction in Multi-Clocked Designs with Safe Capture Technique.},
	author = {Vishal Jain and John A. Waicukauski},
	booktitle = {ITC},
	crossref = {conf/itc/2002},
	pages = {148-153},
	publisher = {IEEE Computer Society},
	url = {http://dblp.uni-trier.de/db/conf/itc/itc2002.html#JainW02},
	year = {2002},
	biburl = {http://www.bibsonomy.org/bibtex/29bf58266b87e328009e6d474a3bd5bc2/dblp},
	description = {dblp},
	ee = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430148abs.htm}, date = {2004-01-14},
	keywords = {dblp }
}