@inproceedings{conf/3dic/SaitoMTSM11,
  added-at = {2012-09-05T00:00:00.000+0200},
  author = {Saito, Naoki and Murata, Naokazu and Tamakawa, Kinji and Suzuki, Ken and Miura, Hideo},
  biburl = {http://www.bibsonomy.org/bibtex/21d931cc1e2a613d5a3818d5dfb54fbd3/dblp},
  booktitle = {3DIC},
  crossref = {conf/3dic/2011},
  editor = {Koyanagi, Mitsumasa and Kada, Morihiro},
  ee = {http://dx.doi.org/10.1109/3DIC.2012.6262998},
  interhash = {6865c1c851f6bc70cdaafc8065e9b61a},
  intrahash = {1d931cc1e2a613d5a3818d5dfb54fbd3},
  isbn = {978-1-4673-2189-1},
  keywords = {dblp},
  pages = {1-6},
  publisher = {IEEE},
  timestamp = {2012-09-05T00:00:00.000+0200},
  title = {Mechanical and electrical reliability of copper interconnections for 3DIC.},
  url = {http://dblp.uni-trier.de/db/conf/3dic/3dic2011.html#SaitoMTSM11},
  year = 2011
}