@inproceedings{Rajan2008,
	title = {The effect of program and model structure on mc/dc test adequacy coverage},
	address = {New York, NY, USA},
	author = {Ajitha Rajan and Michael W. Whalen and Mats P.E. Heimdahl},
	booktitle = {ICSE '08: Proceedings of the 30th international conference on Software engineering},
	note = {MR: nuetzlich fuer IST-SPL nur wegen der Referenzen auf eingesetzte Techniken zur ' Test Case Generation using model checkers '.},
	pages = {161--170},
	publisher = {ACM},
	url = {http://portal.acm.org/citation.cfm?id=1368088.1368111&coll=GUIDE&dl=GUIDE},
	year = {2008},
	biburl = {http://www.bibsonomy.org/bibtex/226d5fee01f752294f19fa61b6b4dab4e/ist_spl},
	abstract = {In avionics and other critical systems domains, adequacy of test suites is currently measured using the MC/DC metric on source code (or on a model in model-based development). We believe that the rigor of the MC/DC metric is highly sensitive to the structure of the implementation and can therefore be misleading as a test adequacy criterion. We investigate this hypothesis by empirically studying the effect of program structure on MC/DC coverage.  To perform this investigation, we use six realistic systems from the civil avionics domain and two toy examples. For each of these systems, we use two versions of their implementation-with and without expression folding (i.e., inlining). To assess the sensitivity of MC/DC to program structure, we first generate test suites that satisfy MC/DC over a non-inlined implementation. We then run the generated test suites over the inlined implementation and measure MC/DC achieved. For our realistic examples, the test suites yield an average reduction of 29.5% in MC/DC achieved over the inlined implementations at 5% statistical significance level.},
	location = {Leipzig, Germany}, isbn = {978-1-60558-079-1}, doi = {http://doi.acm.org/10.1145/1368088.1368111},
	keywords = {automated case checking generation model test }
}