@article{journals/mr/SpraulNMWM07,
	title = {Reliability of SnPb and Pb-free flip-chips under different test conditions.},
	author = {M. Spraul and W. Nüchter and A. Möller and B. Wunderle and B. Michel},
	journal = {Microelectronics Reliability},
	number = {2-3},
	pages = {252-258},
	url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#SpraulNMWM07},
	volume = {47},
	year = {2007},
	biburl = {http://www.bibsonomy.org/bibtex/258160fd97c61a071a67165dee961d087/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1016/j.microrel.2006.09.026}, date = {2007-03-27},
	keywords = {dblp }
}