@article{journals/ibmrd/OGormanRTZMMCW96,
  added-at = {2012-09-21T00:00:00.000+0200},
  author = {O'Gorman, Timothy J. and Ross, John M. and Taber, Allen H. and Ziegler, James F. and Muhlfeld, Hans P. and Montrose, Charles J. and Curtis, Huntington W. and Walsh, James L.},
  biburl = {http://www.bibsonomy.org/bibtex/28532689208c3ff72d2819b51a1fbf62a/dblp},
  ee = {http://dx.doi.org/10.1147/rd.401.0041},
  interhash = {e5df181703e8509eb9283f71ba7bd042},
  intrahash = {8532689208c3ff72d2819b51a1fbf62a},
  journal = {IBM Journal of Research and Development},
  keywords = {dblp},
  number = 1,
  pages = {41-50},
  timestamp = {2012-09-21T00:00:00.000+0200},
  title = {Field testing for cosmic ray soft errors in semiconductor memories.},
  url = {http://dblp.uni-trier.de/db/journals/ibmrd/ibmrd40.html#OGormanRTZMMCW96},
  volume = 40,
  year = 1996
}