@article{journals/mr/FadlallahGJZG02,
	title = {Static and low frequency noise characterization of surface- and buried-mode 0.1 mum P and N MOSFETs.},
	author = {M. Fadlallah and G. Ghibaudo and J. Jomaah and M. Zoaeter and G. Guégan},
	journal = {Microelectronics Reliability},
	number = {1},
	pages = {41-46},
	url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#FadlallahGJZG02},
	volume = {42},
	year = {2002},
	biburl = {http://www.bibsonomy.org/bibtex/2afd6d2822d8583969620f171fd4c74cc/dblp},
	description = {dblp},
	ee = {http://dx.doi.org/10.1016/S0026-2714(01)00232-3}, date = {2007-03-26},
	keywords = {dblp }
}