@article{journals/et/ZjajoGG06,
  added-at = {2007-09-18T00:00:00.000+0200},
  author = {Zjajo, Amir and de Gyvez, José Pineda and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/2b8b22b55779e62446b50ee043d779df4/dblp},
  date = {2007-09-18},
  description = {dblp},
  ee = {http://dx.doi.org/10.1007/s10836-006-9499-1},
  interhash = {b3ba8b2a9c16a4d48c59cdc516789ed8},
  intrahash = {b8b22b55779e62446b50ee043d779df4},
  journal = {J. Electronic Testing},
  keywords = {dblp},
  number = {4-6},
  pages = {399-409},
  timestamp = {2007-09-18T00:00:00.000+0200},
  title = {Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits.},
  url = {http://dblp.uni-trier.de/db/journals/et/et22.html#ZjajoGG06},
  volume = 22,
  year = 2006
}