@article{journals/et/GyvezGA05,
  added-at = {2007-09-18T00:00:00.000+0200},
  author = {de Gyvez, José Pineda and Gronthoud, Guido and Amine, Rashid},
  biburl = {http://www.bibsonomy.org/bibtex/2b9d92d0aa91a11e1e702a4eb410fcee1/dblp},
  date = {2007-09-18},
  description = {dblp},
  ee = {http://dx.doi.org/10.1007/s10836-005-6360-x},
  interhash = {cd4f78ed14e945aa19ca76e69617708b},
  intrahash = {b9d92d0aa91a11e1e702a4eb410fcee1},
  journal = {J. Electronic Testing},
  keywords = {dblp},
  number = 3,
  pages = {311-322},
  timestamp = {2007-09-18T00:00:00.000+0200},
  title = {Multi-VDD Testing for Analog Circuits.},
  url = {http://dblp.uni-trier.de/db/journals/et/et21.html#GyvezGA05},
  volume = 21,
  year = 2005
}