@article{journals/mr/FilippisKNKDGI12,
  added-at = {2012-10-17T00:00:00.000+0200},
  author = {de Filippis, Stefano and Köck, Helmut and Nelhiebel, Michael and Kosel, Vladimir and Decker, Stefan and Glavanovics, Michael and Irace, Andrea},
  biburl = {http://www.bibsonomy.org/bibtex/2cb1ab5d84c4cc7ce0b7362665b437abf/dblp},
  ee = {http://dx.doi.org/10.1016/j.microrel.2012.06.103},
  interhash = {46a98da10b485d7ef30ed1155dbc3eb7},
  intrahash = {cb1ab5d84c4cc7ce0b7362665b437abf},
  journal = {Microelectronics Reliability},
  keywords = {dblp},
  number = {9-10},
  pages = {2374-2379},
  timestamp = {2012-10-17T00:00:00.000+0200},
  title = {Modeling of highly anisotropic microstructures for electro-thermal simulations of power semiconductor devices.},
  url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#FilippisKNKDGI12},
  volume = 52,
  year = 2012
}