@article{journals/tcad/MukhopadhyayKCR06,
	title = {Modeling and Analysis of Leakage Currents in Double-Gate Technologies.},
	author = {Saibal Mukhopadhyay and Keunwoo Kim and Ching-Te Chuang and Kaushik Roy},
	journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
	number = {10},
	pages = {2052-2061},
	url = {http://dblp.uni-trier.de/db/journals/tcad/tcad25.html#MukhopadhyayKCR06},
	volume = {25},
	year = {2006},
	biburl = {http://www.bibsonomy.org/bibtex/2f145acbfcca7adc29814d0f0db187efc/dblp},
	description = {dblp},
	ee = {http://doi.ieeecomputersociety.org/10.1109/TCAD.2006.873892}, date = {2008-08-18},
	keywords = {dblp }
}