@inproceedings{conf/ats/EnokimotoWYMSKAF09,
  added-at = {2012-07-09T00:00:00.000+0200},
  author = {Enokimoto, Kazunari and Wen, Xiaoqing and Yamato, Yuta and Miyase, Kohei and Sone, H. and Kajihara, Seiji and Aso, Masao and Furukawa, Hiroshi},
  biburl = {http://www.bibsonomy.org/bibtex/2fc46a0c3596d99c32ef926f77556050c/dblp},
  booktitle = {Asian Test Symposium},
  crossref = {conf/ats/2009},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2009.22},
  interhash = {8d166e05aee68842ad516b7340d80cb1},
  intrahash = {fc46a0c3596d99c32ef926f77556050c},
  isbn = {978-0-7695-3864-8},
  keywords = {dblp},
  pages = {99-104},
  publisher = {IEEE Computer Society},
  timestamp = {2012-07-09T00:00:00.000+0200},
  title = {CAT: A Critical-Area-Targeted Test Set Modification Scheme for Reducing Launch Switching Activity in At-Speed Scan Testing.},
  url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#EnokimotoWYMSKAF09},
  year = 2009
}