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%0 Conference Paper
%1 conf/iccad/TsukamotoNIOOYMIS05
%A Tsukamoto, Yasumasa
%A Nii, Koji
%A Imaoka, Susumu
%A Oda, Yuji
%A Ohbayashi, Shigeki
%A Yoshizawa, Tomoaki
%A Makino, Hiroshi
%A Ishibashi, Koichiro
%A Shinohara, Hirofumi
%B ICCAD
%D 2005
%I IEEE Computer Society
%K dblp
%P 398-405
%T Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability.
%U http://dblp.uni-trier.de/db/conf/iccad/iccad2005.html#TsukamotoNIOOYMIS05
%@ 0-7803-9254-X
@inproceedings{conf/iccad/TsukamotoNIOOYMIS05,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Tsukamoto, Yasumasa and Nii, Koji and Imaoka, Susumu and Oda, Yuji and Ohbayashi, Shigeki and Yoshizawa, Tomoaki and Makino, Hiroshi and Ishibashi, Koichiro and Shinohara, Hirofumi},
biburl = {https://www.bibsonomy.org/bibtex/299ba086801e4baaf4915a34800e17a53/dblp},
booktitle = {ICCAD},
crossref = {conf/iccad/2005},
ee = {http://dl.acm.org/citation.cfm?id=1129659},
interhash = {01528f3d7cbfa3a8c0d4a15b984496cc},
intrahash = {99ba086801e4baaf4915a34800e17a53},
isbn = {0-7803-9254-X},
keywords = {dblp},
pages = {398-405},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T17:54:49.000+0200},
title = {Worst-case analysis to obtain stable read/write DC margin of high density 6T-SRAM-array with local Vth variability.},
url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2005.html#TsukamotoNIOOYMIS05},
year = 2005
}
