%0 Journal Article %1 journals/tcad/Stapper89 %A Stapper, Charles H. %D 1989 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 12 %P 1314-1318 %T Simulation of spatial fault distributions for integrated circuit yield estimations. %U http://dblp.uni-trier.de/db/journals/tcad/tcad8.html#Stapper89 %V 8

@article{journals/tcad/Stapper89, added-at = {2020-09-24T00:00:00.000+0200}, author = {Stapper, Charles H.}, biburl = {https://www.bibsonomy.org/bibtex/2d514b89c0d0c7fbac70c65c33f4a637b/dblp}, ee = {https://doi.org/10.1109/43.44511}, interhash = {01cde116a5da48328140c5bedb3140b4}, intrahash = {d514b89c0d0c7fbac70c65c33f4a637b}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 12, pages = {1314-1318}, timestamp = {2020-09-25T11:50:13.000+0200}, title = {Simulation of spatial fault distributions for integrated circuit yield estimations.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad8.html#Stapper89}, volume = 8, year = 1989 }