%0 Report %1 HUMP1993 %A Humphrey, James %A Luettgenau, George %D 1993 %K imported %T Reliability considerations in design and use of RF intergrates circuits

@techreport{HUMP1993, added-at = {2013-01-07T16:10:56.000+0100}, author = {Humphrey, James and Luettgenau, George}, biburl = {https://www.bibsonomy.org/bibtex/2fdb0e019a7ee9c1ea3f76d7187345276/olivia.bluder}, file = {:P\:\\KAI_AP2\\People\\Bluder\\Literatur\\Reliability_common\\FREESCALE_Relibility_Considerations.pdf:PDF}, institution = {Freescale Semiconductor, Inc.}, interhash = {03d445bfe841a4a836bf96766f425df8}, intrahash = {fdb0e019a7ee9c1ea3f76d7187345276}, keywords = {imported}, note = {AN1025/D}, owner = {bluder}, timestamp = {2013-01-07T16:11:09.000+0100}, title = {Reliability considerations in design and use of {RF} intergrates circuits}, year = 1993 }