%0 Conference Paper %1 conf/itc/DeG95 %A De, Kaushik %A Gunda, Arun %B ITC %D 1995 %I IEEE Computer Society %K dblp %P 636-645 %T Failure Analysis for Full-Scan Circuits. %U http://dblp.uni-trier.de/db/conf/itc/itc1995.html#DeG95 %@ 0-7803-2992-9

@inproceedings{conf/itc/DeG95, added-at = {2023-03-23T00:00:00.000+0100}, author = {De, Kaushik and Gunda, Arun}, biburl = {https://www.bibsonomy.org/bibtex/232de3cd1fca451da1196020d42c612a5/dblp}, booktitle = {ITC}, crossref = {conf/itc/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1995.529892}, interhash = {0c37c39ffb3b4284c50e9e9c6a16e082}, intrahash = {32de3cd1fca451da1196020d42c612a5}, isbn = {0-7803-2992-9}, keywords = {dblp}, pages = {636-645}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:52:30.000+0200}, title = {Failure Analysis for Full-Scan Circuits.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1995.html#DeG95}, year = 1995 }