%0 Journal Article %1 journals/jssc/DaitoNSGKKIIKTS11 %A Daito, Mutsuo %A Nakata, Yoshiro %A Sasaki, Satoshi %A Gomyo, Hiroyuki %A Kusamitsu, Hideki %A Komoto, Yoshio %A Iizuka, Kunihiko %A Ikeuchi, Katsuyuki %A Kim, Gil-Su %A Takamiya, Makoto %A Sakurai, Takayasu %D 2011 %J IEEE J. Solid State Circuits %K dblp %N 10 %P 2386-2395 %T Capacitively Coupled Non-Contact Probing Circuits for Membrane-Based Wafer-Level Simultaneous Testing. %U http://dblp.uni-trier.de/db/journals/jssc/jssc46.html#DaitoNSGKKIIKTS11 %V 46

@article{journals/jssc/DaitoNSGKKIIKTS11, added-at = {2020-08-30T00:00:00.000+0200}, author = {Daito, Mutsuo and Nakata, Yoshiro and Sasaki, Satoshi and Gomyo, Hiroyuki and Kusamitsu, Hideki and Komoto, Yoshio and Iizuka, Kunihiko and Ikeuchi, Katsuyuki and Kim, Gil-Su and Takamiya, Makoto and Sakurai, Takayasu}, biburl = {https://www.bibsonomy.org/bibtex/29f135b001c5bfa62b6406bdf230bcec8/dblp}, ee = {https://doi.org/10.1109/JSSC.2011.2160790}, interhash = {030379e80416207fe2ce1df131ca0608}, intrahash = {9f135b001c5bfa62b6406bdf230bcec8}, journal = {IEEE J. Solid State Circuits}, keywords = {dblp}, number = 10, pages = {2386-2395}, timestamp = {2020-08-31T11:41:48.000+0200}, title = {Capacitively Coupled Non-Contact Probing Circuits for Membrane-Based Wafer-Level Simultaneous Testing.}, url = {http://dblp.uni-trier.de/db/journals/jssc/jssc46.html#DaitoNSGKKIIKTS11}, volume = 46, year = 2011 }