%0 Journal Article %1 journals/tcad/BhuvaPGK89 %A Bhuva, Bharat L. %A Paulos, John J. %A Gyurcsik, Ronald S. %A Kerns, Sherra E. %D 1989 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 9 %P 933-938 %T Switch-level simulation of total dose effects on CMOS VLSI circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad8.html#BhuvaPGK89 %V 8

@article{journals/tcad/BhuvaPGK89, added-at = {2020-09-24T00:00:00.000+0200}, author = {Bhuva, Bharat L. and Paulos, John J. and Gyurcsik, Ronald S. and Kerns, Sherra E.}, biburl = {https://www.bibsonomy.org/bibtex/2d4dec48ac69503e826139c162d6ef09c/dblp}, ee = {https://doi.org/10.1109/43.35545}, interhash = {0514927b6610381e6a3724e74adf1db8}, intrahash = {d4dec48ac69503e826139c162d6ef09c}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 9, pages = {933-938}, timestamp = {2020-09-25T11:48:28.000+0200}, title = {Switch-level simulation of total dose effects on CMOS VLSI circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad8.html#BhuvaPGK89}, volume = 8, year = 1989 }